Matches in DBpedia 2016-04 for { <http://wikidata.dbpedia.org/resource/Q455003> ?p ?o }
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- Q455003 subject Q7162170.
- Q455003 subject Q7353445.
- Q455003 subject Q7464146.
- Q455003 subject Q8790127.
- Q455003 abstract "Reflection high-energy electron diffraction (RHEED) is a technique used to characterize the surface of crystalline materials. RHEED systems gather information only from the surface layer of the sample, which distinguishes RHEED from other materials characterization methods that also rely on diffraction of high-energy electrons. Transmission electron microscopy, another common electron diffraction method samples the bulk of the sample due to the geometry of the system. Low-energy electron diffraction (LEED) is also surface sensitive, but LEED achieves surface sensitivity through the use of low energy electrons.".
- Q455003 thumbnail RHEED.svg?width=300.
- Q455003 wikiPageWikiLink Q1128174.
- Q455003 wikiPageWikiLink Q174211.
- Q455003 wikiPageWikiLink Q178150.
- Q455003 wikiPageWikiLink Q191807.
- Q455003 wikiPageWikiLink Q207340.
- Q455003 wikiPageWikiLink Q2225.
- Q455003 wikiPageWikiLink Q2458815.
- Q455003 wikiPageWikiLink Q3296834.
- Q455003 wikiPageWikiLink Q386334.
- Q455003 wikiPageWikiLink Q440818.
- Q455003 wikiPageWikiLink Q4751159.
- Q455003 wikiPageWikiLink Q5073781.
- Q455003 wikiPageWikiLink Q568.
- Q455003 wikiPageWikiLink Q569.
- Q455003 wikiPageWikiLink Q670.
- Q455003 wikiPageWikiLink Q7162170.
- Q455003 wikiPageWikiLink Q7353445.
- Q455003 wikiPageWikiLink Q743.
- Q455003 wikiPageWikiLink Q744818.
- Q455003 wikiPageWikiLink Q7464146.
- Q455003 wikiPageWikiLink Q783800.
- Q455003 wikiPageWikiLink Q864822.
- Q455003 wikiPageWikiLink Q8790127.
- Q455003 wikiPageWikiLink Q898542.
- Q455003 wikiPageWikiLink Q899530.
- Q455003 wikiPageWikiLink Q901260.
- Q455003 wikiPageWikiLink Q901863.
- Q455003 wikiPageWikiLink Q905977.
- Q455003 comment "Reflection high-energy electron diffraction (RHEED) is a technique used to characterize the surface of crystalline materials. RHEED systems gather information only from the surface layer of the sample, which distinguishes RHEED from other materials characterization methods that also rely on diffraction of high-energy electrons. Transmission electron microscopy, another common electron diffraction method samples the bulk of the sample due to the geometry of the system.".
- Q455003 label "Reflection high-energy electron diffraction".
- Q455003 depiction RHEED.svg.
