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- Q16029538 subject Q6425689.
- Q16029538 subject Q7434136.
- Q16029538 subject Q7461013.
- Q16029538 abstract "Non-contact atomic force microscopy (nc-AFM), also known as dynamic force microscopy (DFM), is a mode of atomic force microscopy, which itself is a type of scanning probe microscopy. In nc-AFM a sharp probe is moved close (order of Angstroms) to the surface under study, the probe is then raster scanned across the surface, the image is then constructed from the force interactions during the scan. The probe is connected to a resonator, usually a silicon cantilever or a quartz crystal resonator. During in measurements the sensor is driven so that it oscillates. The force interactions are measured either by measuring the change in amplitude of the oscillation at a constant frequency just off resonance (amplitude modulation) or by measuring the change in resonant frequency directly using a feedback circuit (usually a phase-locked loop) to always drive the sensor on resonance (frequency modulation).".
- Q16029538 thumbnail NTCDI_AFM2.jpg?width=300.
- Q16029538 wikiPageWikiLink Q1130571.
- Q16029538 wikiPageWikiLink Q1203476.
- Q16029538 wikiPageWikiLink Q1382248.
- Q16029538 wikiPageWikiLink Q17227.
- Q16029538 wikiPageWikiLink Q172858.
- Q16029538 wikiPageWikiLink Q175646.
- Q16029538 wikiPageWikiLink Q183759.
- Q16029538 wikiPageWikiLink Q185553.
- Q16029538 wikiPageWikiLink Q189627.
- Q16029538 wikiPageWikiLink Q190070.
- Q16029538 wikiPageWikiLink Q2025.
- Q16029538 wikiPageWikiLink Q230187.
- Q16029538 wikiPageWikiLink Q2641959.
- Q16029538 wikiPageWikiLink Q2799395.
- Q16029538 wikiPageWikiLink Q49295.
- Q16029538 wikiPageWikiLink Q52637.
- Q16029538 wikiPageWikiLink Q569057.
- Q16029538 wikiPageWikiLink Q6425689.
- Q16029538 wikiPageWikiLink Q743.
- Q16029538 wikiPageWikiLink Q7434136.
- Q16029538 wikiPageWikiLink Q7461013.
- Q16029538 wikiPageWikiLink Q7880334.
- Q16029538 wikiPageWikiLink Q81454.
- Q16029538 wikiPageWikiLink Q819992.
- Q16029538 wikiPageWikiLink Q830521.
- Q16029538 wikiPageWikiLink Q877055.
- Q16029538 wikiPageWikiLink Q907287.
- Q16029538 comment "Non-contact atomic force microscopy (nc-AFM), also known as dynamic force microscopy (DFM), is a mode of atomic force microscopy, which itself is a type of scanning probe microscopy. In nc-AFM a sharp probe is moved close (order of Angstroms) to the surface under study, the probe is then raster scanned across the surface, the image is then constructed from the force interactions during the scan. The probe is connected to a resonator, usually a silicon cantilever or a quartz crystal resonator.".
- Q16029538 label "Non-contact atomic force microscopy".
- Q16029538 depiction NTCDI_AFM2.jpg.