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- Q1601835 subject Q7149609.
- Q1601835 abstract "Standard Test Data Format (STDF) is a proprietary file format for semiconductor test information originally developed by Teradyne, but it is now a de facto standard widely used throughout the semiconductor industry. It is a commonly used format produced by automatic test equipment (ATE) platforms from companies such as LTX-Credence, Roos Instruments, Teradyne, Advantest, and others. STDF is a binary format, but can be converted either to an ASCII format known as ATDF or to a tab delimited text file. Decoding the STDF variable length binary field data format to extract ASCII text is non-trivial as it involves a detailed comprehension of the STDF specification, the current (2007) version 4 specification being over 100 pages in length. Software tools exist for processing STDF generated files and performing statistical analysis on a population of tested devices.".
- Q1601835 wikiPageExternalLink stdfv4-spec.pdf.
- Q1601835 wikiPageExternalLink pystdf.
- Q1601835 wikiPageExternalLink stdf4j.
- Q1601835 wikiPageExternalLink stdfparser.
- Q1601835 wikiPageExternalLink DOC-15174.
- Q1601835 wikiPageExternalLink freestdf.sourceforge.net.
- Q1601835 wikiPageExternalLink ttsg.
- Q1601835 wikiPageExternalLink stdf.radar.googlepages.com.
- Q1601835 wikiPageExternalLink CAST.
- Q1601835 wikiPageExternalLink linqtostdf.codeplex.com.
- Q1601835 wikiPageExternalLink standard-test-data-format-stdf.
- Q1601835 wikiPageWikiLink Q11456.
- Q1601835 wikiPageWikiLink Q1206780.
- Q1601835 wikiPageWikiLink Q12483.
- Q1601835 wikiPageWikiLink Q16253671.
- Q1601835 wikiPageWikiLink Q218013.
- Q1601835 wikiPageWikiLink Q235557.
- Q1601835 wikiPageWikiLink Q2404292.
- Q1601835 wikiPageWikiLink Q2722179.
- Q1601835 wikiPageWikiLink Q363815.
- Q1601835 wikiPageWikiLink Q385853.
- Q1601835 wikiPageWikiLink Q7149609.
- Q1601835 wikiPageWikiLink Q7366384.
- Q1601835 wikiPageWikiLink Q8815.
- Q1601835 comment "Standard Test Data Format (STDF) is a proprietary file format for semiconductor test information originally developed by Teradyne, but it is now a de facto standard widely used throughout the semiconductor industry. It is a commonly used format produced by automatic test equipment (ATE) platforms from companies such as LTX-Credence, Roos Instruments, Teradyne, Advantest, and others.".
- Q1601835 label "Standard Test Data Format".