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- insi.47.4.216.63149 date "April 2005".
- insi.47.4.216.63149 doi "10.1784/insi.47.4.216.63149".
- insi.47.4.216.63149 first1 "M. L.".
- insi.47.4.216.63149 first2 "G.".
- insi.47.4.216.63149 first3 "V.".
- insi.47.4.216.63149 first4 "B.".
- insi.47.4.216.63149 first5 "P.".
- insi.47.4.216.63149 isCitedBy Nondestructive_testing.
- insi.47.4.216.63149 isCitedBy Optical_coherence_tomography.
- insi.47.4.216.63149 isCitedBy Profilometer.
- insi.47.4.216.63149 issn "1354-2575".
- insi.47.4.216.63149 issue "4".
- insi.47.4.216.63149 journal British_Institute_of_Non-Destructive_Testing.
- insi.47.4.216.63149 last1 "Dufour".
- insi.47.4.216.63149 last2 "Lamouche".
- insi.47.4.216.63149 last3 "Detalle".
- insi.47.4.216.63149 last4 "Gauthier".
- insi.47.4.216.63149 last5 "Sammut".
- insi.47.4.216.63149 pages "216–219".
- insi.47.4.216.63149 title "Low-Coherence Interferometry, an Advanced Technique for Optical Metrology in Industry".
- insi.47.4.216.63149 url "http://www.ndt.net/abstract/wcndt2004/671.htm".
- insi.47.4.216.63149 volume "47".