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- science.276.5312.579 author "Yoo, M. J.".
- science.276.5312.579 author2 "Fulton, T. A. and Hess, H. F. and Willett, R. L. and Dunkleberger, L. N. and Chichester, R. J. and Pfeiffer, L. N. and West, K. W.".
- science.276.5312.579 date "1997-04-25".
- science.276.5312.579 doi "10.1126/science.276.5312.579".
- science.276.5312.579 isCitedBy Scanning_probe_microscopy.
- science.276.5312.579 journal "Science".
- science.276.5312.579 number "5312".
- science.276.5312.579 pages "579–582".
- science.276.5312.579 title "Scanning Single-Electron Transistor Microscopy: Imaging Individual Charges.".
- science.276.5312.579 volume "276".