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- 1.2232380 author2 "Charlene Johnson".
- 1.2232380 author3 "Kisik Choi".
- 1.2232380 bibcode "2006JVSTB..24.2457G".
- 1.2232380 date "September 2006".
- 1.2232380 doi "10.1116/1.2232380".
- 1.2232380 first "Carolyn F. H.".
- 1.2232380 isCitedBy Auger_electron_spectroscopy.
- 1.2232380 issue "5".
- 1.2232380 journal Journal_of_Vacuum_Science_and_Technology_B.
- 1.2232380 last "Gondran".
- 1.2232380 pages "2457".
- 1.2232380 title "Front and back side Auger electron spectroscopy depth profile analysis to verify an interfacial reaction at the HfN/SiO2 interface".
- 1.2232380 volume "24".