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- ted.2002.807249 accessdate "2011-12-17".
- ted.2002.807249 author2 "Folkerts, Hein Otto".
- ted.2002.807249 author3 "Maas, Joris P. V.".
- ted.2002.807249 author4 "Verbugt, Joris P. V.".
- ted.2002.807249 author5 "Daniël W. E. Mierop, Adri J.".
- ted.2002.807249 author6 "Hoekstra, Willem".
- ted.2002.807249 author7 "Roks, Edwin and Theuwissen, Albert J. P.".
- ted.2002.807249 date "January 2003".
- ted.2002.807249 doi "10.1109/TED.2002.807249".
- ted.2002.807249 first "Natalia V.".
- ted.2002.807249 isCitedBy Image_sensor_format.
- ted.2002.807249 issue "1".
- ted.2002.807249 journal "IEEE Transactions on Electron Devices".
- ted.2002.807249 last "Loukianova".
- ted.2002.807249 pages "77–83".
- ted.2002.807249 title "Leakage Current Modeling of Test Structures for Characterization of Dark Current in CMOS Image Sensors".
- ted.2002.807249 url "http://www.harvestimaging.com/pubdocs/073_2003_jan_TED_leakage_current.pdf".
- ted.2002.807249 volume "50".