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- ipfa.2008.4588174 chapter "Investigation of soft fail issue in sub-nanometer devices using nanoprobing technique".
- ipfa.2008.4588174 doi "10.1109/IPFA.2008.4588174".
- ipfa.2008.4588174 first1 "E.".
- ipfa.2008.4588174 first2 "H. B.".
- ipfa.2008.4588174 first3 "S. L.".
- ipfa.2008.4588174 first4 "P. K.".
- ipfa.2008.4588174 first5 "Y. W.".
- ipfa.2008.4588174 first6 "Z. H.".
- ipfa.2008.4588174 first7 "J.".
- ipfa.2008.4588174 isCitedBy Nanoprobing.
- ipfa.2008.4588174 isbn "978-1-4244-2039-1".
- ipfa.2008.4588174 last1 "Hendarto".
- ipfa.2008.4588174 last2 "Lin".
- ipfa.2008.4588174 last3 "Toh".
- ipfa.2008.4588174 last4 "Tan".
- ipfa.2008.4588174 last5 "Goh".
- ipfa.2008.4588174 last6 "Mai".
- ipfa.2008.4588174 last7 "Lam".
- ipfa.2008.4588174 pages "1".
- ipfa.2008.4588174 title "2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits".
- ipfa.2008.4588174 year "2008".