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- 1.2149222 author "Y. Naitou".
- 1.2149222 author2 "A. Ando".
- 1.2149222 author3 "H. Ogiso".
- 1.2149222 author4 "S. Kamiyama".
- 1.2149222 author5 "Y. Nara".
- 1.2149222 author6 "K. Nakamura".
- 1.2149222 bibcode "2005ApPhL..87y2908N".
- 1.2149222 doi "10.1063/1.2149222".
- 1.2149222 isCitedBy Scanning_capacitance_microscopy.
- 1.2149222 issue "25".
- 1.2149222 journal Applied_Physics_Letters.
- 1.2149222 pages "252908–1 to 252908–3".
- 1.2149222 title "Spatial fluctuation of dielectric properties in Hf-based high-k gate films studied by scanning capacitance microscopy".
- 1.2149222 volume "87".
- 1.2149222 year "2005".