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- 1.1611263 author "K.N. Tu".
- 1.1611263 bibcode "2003JAP....94.5451T".
- 1.1611263 doi "10.1063/1.1611263".
- 1.1611263 isCitedBy Electromigration.
- 1.1611263 issue "9".
- 1.1611263 journal "Journal of Applied Physics".
- 1.1611263 title "Recent advances on electromigration in very-large-scale-integration of interconnects".
- 1.1611263 volume "94".
- 1.1611263 year "2003".