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- 1.117669 accessDate "2015-05-06".
- 1.117669 bibcode "1996ApPhL..69.2767C".
- 1.117669 date "1996-10-28".
- 1.117669 doi "10.1063/1.117669".
- 1.117669 first "B. W.".
- 1.117669 first2 "T. D.".
- 1.117669 first3 "T. W.".
- 1.117669 first4 "H. J.".
- 1.117669 first5 "B. D.".
- 1.117669 first6 "D.".
- 1.117669 isCitedBy Thermal_scanning_probe_lithography.
- 1.117669 issn "0003-6951".
- 1.117669 issue "18".
- 1.117669 journal "Applied Physics Letters".
- 1.117669 last "Chui".
- 1.117669 last2 "Stowe".
- 1.117669 last3 "Kenny".
- 1.117669 last4 "Mamin".
- 1.117669 last5 "Terris".
- 1.117669 last6 "Rugar".
- 1.117669 pages "2767–2769".
- 1.117669 title "Low‐stiffness silicon cantilevers for thermal writing and piezoresistive readback with the atomic force microscope".
- 1.117669 url "http://scitation.aip.org/content/aip/journal/apl/69/18/10.1063/1.117669".
- 1.117669 volume "69".