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- s1431927610094171 doi "10.1017/S1431927610094171".
- s1431927610094171 first1 "Robert".
- s1431927610094171 first2 "Huolin L.".
- s1431927610094171 first3 "David A.".
- s1431927610094171 isCitedBy Focus_stacking.
- s1431927610094171 issue "1".
- s1431927610094171 journal "Microscopy and Microanalysis".
- s1431927610094171 last1 "Hovden".
- s1431927610094171 last2 "Xin".
- s1431927610094171 last3 "Muller".
- s1431927610094171 pages "75–80".
- s1431927610094171 pmid "21122192".
- s1431927610094171 title "Extended Depth of Field for High-Resolution Scanning Transmission Electron Microscopy".
- s1431927610094171 volume "17".
- s1431927610094171 year "2010".