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- s1431927608085589 author "Myers BD, Pan Z and Dravid VP".
- s1431927608085589 doi "10.1017/S1431927608085589".
- s1431927608085589 isCitedBy Environmental_scanning_electron_microscope.
- s1431927608085589 journal "Microscopy and Microanalysis".
- s1431927608085589 pages "1208–120".
- s1431927608085589 title "Beam skirting effects on energy deposition profile in VP-SEM. Microscopy and Microanalysis".
- s1431927608085589 volume "14".
- s1431927608085589 year "2008".