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- s1431927608080902 author "C. Kisielowski".
- s1431927608080902 author "C. Kisielowski, B. Freitag, M. Bischoff, H. van Lin, S. Lazar, G. Knippels, P. Tiemeijer, M. van der Stam, S. von Harrach, M. Stekelenburg, M. Haider, H. Muller, P. Hartel, B. Kabius, D. Miller, I. Petrov, E. Olson, T. Donchev, E. A. Kenik, A. Lupini, J. Bentley, S. Pennycook, A. M. Minor, A. K. Schmid, T. Duden, V. Radmilovic, Q. Ramasse, R. Erni, M. Watanabe, E. Stach, P. Denes, U. Dahmen".
- s1431927608080902 displayAuthors "etal".
- s1431927608080902 doi "10.1017/S1431927608080902".
- s1431927608080902 isCitedBy High-resolution_transmission_electron_microscopy.
- s1431927608080902 isCitedBy Transmission_Electron_Aberration-Corrected_Microscope.
- s1431927608080902 journal "Microscopy Microanalysis".
- s1431927608080902 journal "Microscopy and Microanalysis".
- s1431927608080902 pages "469–477".
- s1431927608080902 pages "469–477".
- s1431927608080902 title "Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit".
- s1431927608080902 title "Detection of single atoms and buried defects in three dimensions by aberration-corrected electron microscopy with 0.5 Å information limit".
- s1431927608080902 url "http://ncem.lbl.gov/team/TEAM%20pubs/MAM14-5_Kisielowski_et_al-Author.pdf".
- s1431927608080902 volume "14".
- s1431927608080902 year "2008".