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- s1431927605502460 author "Principe, E L".
- s1431927605502460 doi "10.1017/S1431927605502460".
- s1431927605502460 first2 "P".
- s1431927605502460 first3 "P".
- s1431927605502460 isCitedBy Focused_ion_beam.
- s1431927605502460 journal "Microscopy and Microanalysis".
- s1431927605502460 last2 "Gnauck".
- s1431927605502460 last3 "Hoffrogge".
- s1431927605502460 title "A Three Beam Approach to TEM Preparation Using In-situ Low Voltage Argon Ion Final Milling in a FIB-SEM Instrument".
- s1431927605502460 volume "11".
- s1431927605502460 year "2005".