Matches in DBpedia 2016-04 for { <http://doi.org/10.1016/s0921-5107(01)01061-3> ?p ?o }
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- s0921-5107(01)01061-3 date "2002-04-30".
- s0921-5107(01)01061-3 doi "10.1016/S0921-510701061-3".
- s0921-5107(01)01061-3 first "Youwen".
- s0921-5107(01)01061-3 first2 "Niefeng".
- s0921-5107(01)01061-3 first3 "Hongwei".
- s0921-5107(01)01061-3 first4 "Jinghua".
- s0921-5107(01)01061-3 first5 "Jianqun".
- s0921-5107(01)01061-3 first6 "Tongnian".
- s0921-5107(01)01061-3 first7 "Lanying".
- s0921-5107(01)01061-3 isCitedBy Lanying_Lin.
- s0921-5107(01)01061-3 journal "Materials Science and Engineering: B".
- s0921-5107(01)01061-3 last "Zhao".
- s0921-5107(01)01061-3 last2 "Sun".
- s0921-5107(01)01061-3 last3 "Dong".
- s0921-5107(01)01061-3 last4 "Jiao".
- s0921-5107(01)01061-3 last5 "Zhao".
- s0921-5107(01)01061-3 last6 "Sun".
- s0921-5107(01)01061-3 last7 "Lin".
- s0921-5107(01)01061-3 pages "521–524".
- s0921-5107(01)01061-3 title "Characterization of defects and whole wafer uniformity of annealed undoped semi-insulating InP wafers".
- s0921-5107(01)01061-3 url "http://www.sciencedirect.com/science/article/pii/S0921510701010613".
- s0921-5107(01)01061-3 volume "91–92".