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- j.mser.2007.04.002 author "Cher Ming Tan, Arijit Roy".
- j.mser.2007.04.002 doi "10.1016/j.mser.2007.04.002".
- j.mser.2007.04.002 isCitedBy Electromigration.
- j.mser.2007.04.002 journal "Materials Science and Engineering: R: Reports".
- j.mser.2007.04.002 pages "1–75".
- j.mser.2007.04.002 title "Electromigration in ULSI interconnects".
- j.mser.2007.04.002 volume "58".
- j.mser.2007.04.002 year "2007".