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- adfm.201102383 doi "10.1002/adfm.201102383".
- adfm.201102383 first1 "Mark A.".
- adfm.201102383 first2 "Bernd".
- adfm.201102383 first3 "Papot".
- adfm.201102383 first4 "Tevis D. B.".
- adfm.201102383 first5 "Sean D.".
- adfm.201102383 first6 "Kumar".
- adfm.201102383 first7 "Robert W.".
- adfm.201102383 isCitedBy Thermal_scanning_probe_lithography.
- adfm.201102383 issue "8".
- adfm.201102383 journal "Advanced Functional Materials".
- adfm.201102383 last1 "Lantz".
- adfm.201102383 last2 "Gotsmann".
- adfm.201102383 last3 "Jaroenapibal".
- adfm.201102383 last4 "Jacobs".
- adfm.201102383 last5 "O'Connor".
- adfm.201102383 last6 "Sridharan".
- adfm.201102383 last7 "Carpick".
- adfm.201102383 pages "1639".
- adfm.201102383 title "Wear-Resistant Nanoscale Silicon Carbide Tips for Scanning Probe Applications".
- adfm.201102383 volume "22".
- adfm.201102383 year "2012".