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- Standard_Test_Data_Format abstract "Standard Test Data Format (STDF) is a proprietary file format for semiconductor test information originally developed by Teradyne, but it is now a de facto standard widely used throughout the semiconductor industry. It is a commonly used format produced by automatic test equipment (ATE) platforms from companies such as LTX-Credence, Roos Instruments, Teradyne, Advantest, and others. STDF is a binary format, but can be converted either to an ASCII format known as ATDF or to a tab delimited text file. Decoding the STDF variable length binary field data format to extract ASCII text is non-trivial as it involves a detailed comprehension of the STDF specification, the current (2007) version 4 specification being over 100 pages in length. Software tools exist for processing STDF generated files and performing statistical analysis on a population of tested devices.".
- Standard_Test_Data_Format wikiPageExternalLink stdfv4-spec.pdf.
- Standard_Test_Data_Format wikiPageExternalLink pystdf.
- Standard_Test_Data_Format wikiPageExternalLink stdf4j.
- Standard_Test_Data_Format wikiPageExternalLink stdfparser.
- Standard_Test_Data_Format wikiPageExternalLink DOC-15174.
- Standard_Test_Data_Format wikiPageExternalLink freestdf.sourceforge.net.
- Standard_Test_Data_Format wikiPageExternalLink ttsg.
- Standard_Test_Data_Format wikiPageExternalLink stdf.radar.googlepages.com.
- Standard_Test_Data_Format wikiPageExternalLink CAST.
- Standard_Test_Data_Format wikiPageExternalLink linqtostdf.codeplex.com.
- Standard_Test_Data_Format wikiPageExternalLink standard-test-data-format-stdf.
- Standard_Test_Data_Format wikiPageID "8721680".
- Standard_Test_Data_Format wikiPageLength "2316".
- Standard_Test_Data_Format wikiPageOutDegree "15".
- Standard_Test_Data_Format wikiPageRevisionID "681025055".
- Standard_Test_Data_Format wikiPageWikiLink ASCII.
- Standard_Test_Data_Format wikiPageWikiLink Advantest.
- Standard_Test_Data_Format wikiPageWikiLink Automatic_test_equipment.
- Standard_Test_Data_Format wikiPageWikiLink Binary_file.
- Standard_Test_Data_Format wikiPageWikiLink Category:Computer_file_formats.
- Standard_Test_Data_Format wikiPageWikiLink Category:Hardware_testing_file_formats.
- Standard_Test_Data_Format wikiPageWikiLink De_facto_standard.
- Standard_Test_Data_Format wikiPageWikiLink Device_under_test.
- Standard_Test_Data_Format wikiPageWikiLink File_format.
- Standard_Test_Data_Format wikiPageWikiLink LTX-Credence.
- Standard_Test_Data_Format wikiPageWikiLink Roos_Instruments.
- Standard_Test_Data_Format wikiPageWikiLink Semiconductor.
- Standard_Test_Data_Format wikiPageWikiLink Statistics.
- Standard_Test_Data_Format wikiPageWikiLink Teradyne.
- Standard_Test_Data_Format wikiPageWikiLinkText "Standard Test Data Format".
- Standard_Test_Data_Format wikiPageUsesTemplate Template:Tech-stub.
- Standard_Test_Data_Format subject Category:Computer_file_formats.
- Standard_Test_Data_Format subject Category:Hardware_testing_file_formats.
- Standard_Test_Data_Format hypernym Format.
- Standard_Test_Data_Format type Software.
- Standard_Test_Data_Format comment "Standard Test Data Format (STDF) is a proprietary file format for semiconductor test information originally developed by Teradyne, but it is now a de facto standard widely used throughout the semiconductor industry. It is a commonly used format produced by automatic test equipment (ATE) platforms from companies such as LTX-Credence, Roos Instruments, Teradyne, Advantest, and others.".
- Standard_Test_Data_Format label "Standard Test Data Format".
- Standard_Test_Data_Format sameAs Q1601835.
- Standard_Test_Data_Format sameAs Standard_Test_Data_Format.
- Standard_Test_Data_Format sameAs Standard_Test_Data_Format.
- Standard_Test_Data_Format sameAs m.027g89l.
- Standard_Test_Data_Format sameAs Q1601835.
- Standard_Test_Data_Format wasDerivedFrom Standard_Test_Data_Format?oldid=681025055.
- Standard_Test_Data_Format isPrimaryTopicOf Standard_Test_Data_Format.