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- Process_corners abstract "In semiconductor manufacturing, a process corner is an example of a design-of-experiments (DoE) technique that refers to a variation of fabrication parameters used in applying an integrated circuit design to a semiconductor wafer. Process corners represent the extremes of these parameter variations within which a circuit that has been etched onto the wafer must function correctly. A circuit running on devices fabricated at these process corners may run slower or faster than specified and at lower or higher temperatures and voltages, but if the circuit does not function at all at any of these process extremes the design is considered to have inadequate design margin.In order to verify the robustness of an integrated circuit design, semiconductor manufacturers will fabricate corner lots, which are groups of wafers that have had process parameters adjusted according to these extremes, and will then test the devices made from these special wafers at varying increments of environmental conditions, such as voltage, clock frequency, and temperature, applied in combination (two or sometimes all three together) in a process called characterization. The results of these tests are plotted using a graphing technique known as a shmoo plot that indicates clearly the boundary limit beyond which a device begins to fail for a given combination of these environmental conditions.Corner-lot analysis is most effective in digital electronics because of the direct effect of process variations on the speed of transistor switching during transitions from one logic state to another, which is not relevant for analog circuits, such as amplifiers.".
- Process_corners wikiPageExternalLink why-three-sigma.
- Process_corners wikiPageExternalLink patents?id=EKwOAAAAEBAJ.
- Process_corners wikiPageID "18648165".
- Process_corners wikiPageLength "6754".
- Process_corners wikiPageOutDegree "33".
- Process_corners wikiPageRevisionID "703518823".
- Process_corners wikiPageWikiLink 90_nanometer.
- Process_corners wikiPageWikiLink BSIM.
- Process_corners wikiPageWikiLink Catastrophic_failure.
- Process_corners wikiPageWikiLink Category:Integrated_circuits.
- Process_corners wikiPageWikiLink Circuit_extraction.
- Process_corners wikiPageWikiLink Cleanroom.
- Process_corners wikiPageWikiLink Design_of_experiments.
- Process_corners wikiPageWikiLink Die_(integrated_circuit).
- Process_corners wikiPageWikiLink Dopant.
- Process_corners wikiPageWikiLink Duty_cycle.
- Process_corners wikiPageWikiLink Electron_mobility.
- Process_corners wikiPageWikiLink Field-effect_transistor.
- Process_corners wikiPageWikiLink Flip-flop_(electronics).
- Process_corners wikiPageWikiLink Integrated_circuit.
- Process_corners wikiPageWikiLink Integrated_circuit_layout.
- Process_corners wikiPageWikiLink Logic_gate.
- Process_corners wikiPageWikiLink MOSFET.
- Process_corners wikiPageWikiLink Microprocessor.
- Process_corners wikiPageWikiLink Product_binning.
- Process_corners wikiPageWikiLink Real_versus_nominal_value.
- Process_corners wikiPageWikiLink SPICE.
- Process_corners wikiPageWikiLink Semiconductor.
- Process_corners wikiPageWikiLink Semiconductor_device_fabrication.
- Process_corners wikiPageWikiLink Shmoo_plot.
- Process_corners wikiPageWikiLink Simulation.
- Process_corners wikiPageWikiLink Skew.
- Process_corners wikiPageWikiLink Slew_rate.
- Process_corners wikiPageWikiLink Standard_deviation.
- Process_corners wikiPageWikiLink Tape-out.
- Process_corners wikiPageWikiLink Very-large-scale_integration.
- Process_corners wikiPageWikiLink Wafer_(electronics).
- Process_corners wikiPageWikiLinkText "Process, Voltage, Temperature (EE)".
- Process_corners wikiPageWikiLinkText "Process_corners#Types_of_corners".
- Process_corners wikiPageWikiLinkText "corners".
- Process_corners wikiPageWikiLinkText "on-chip variation".
- Process_corners wikiPageWikiLinkText "process corners".
- Process_corners wikiPageUsesTemplate Template:Reflist.
- Process_corners subject Category:Integrated_circuits.
- Process_corners hypernym Example.
- Process_corners type Building.
- Process_corners type Circuit.
- Process_corners comment "In semiconductor manufacturing, a process corner is an example of a design-of-experiments (DoE) technique that refers to a variation of fabrication parameters used in applying an integrated circuit design to a semiconductor wafer. Process corners represent the extremes of these parameter variations within which a circuit that has been etched onto the wafer must function correctly.".
- Process_corners label "Process corners".
- Process_corners sameAs Q7247268.
- Process_corners sameAs m.04gqn03.
- Process_corners sameAs Q7247268.
- Process_corners wasDerivedFrom Process_corners?oldid=703518823.
- Process_corners isPrimaryTopicOf Process_corners.