Matches in DBpedia 2016-04 for { <http://dbpedia.org/resource/Parallel_parametric_test> ?p ?o }
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- Parallel_parametric_test abstract "The parallel parametric test is an emerging strategy for wafer-level parametric testing that involves concurrent execution of multiple tests on multiple scribe line test structures. If offers the potential for increasing test throughput with existing test hardware, in response to market pressure on fabs to minimize test times. The figure illustrates the differences in the amount of time required to complete tests sequentially as compared to the same tests in parallel.".
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- Parallel_parametric_test wikiPageWikiLink Category:Semiconductor_analysis.
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- Parallel_parametric_test wikiPageWikiLink Semiconductor_fabrication_plant.
- Parallel_parametric_test wikiPageWikiLink Total_cost_of_ownership.
- Parallel_parametric_test wikiPageWikiLinkText "Parallel parametric test".
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- Parallel_parametric_test wikiPageUsesTemplate Template:Context.
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- Parallel_parametric_test subject Category:Semiconductor_analysis.
- Parallel_parametric_test hypernym Strategy.
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- Parallel_parametric_test type Semiconductor.
- Parallel_parametric_test comment "The parallel parametric test is an emerging strategy for wafer-level parametric testing that involves concurrent execution of multiple tests on multiple scribe line test structures. If offers the potential for increasing test throughput with existing test hardware, in response to market pressure on fabs to minimize test times. The figure illustrates the differences in the amount of time required to complete tests sequentially as compared to the same tests in parallel.".
- Parallel_parametric_test label "Parallel parametric test".
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- Parallel_parametric_test depiction Parallel.gif.
- Parallel_parametric_test isPrimaryTopicOf Parallel_parametric_test.
