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- Non-contact_atomic_force_microscopy abstract "Non-contact atomic force microscopy (nc-AFM), also known as dynamic force microscopy (DFM), is a mode of atomic force microscopy, which itself is a type of scanning probe microscopy. In nc-AFM a sharp probe is moved close (order of Angstroms) to the surface under study, the probe is then raster scanned across the surface, the image is then constructed from the force interactions during the scan. The probe is connected to a resonator, usually a silicon cantilever or a quartz crystal resonator. During in measurements the sensor is driven so that it oscillates. The force interactions are measured either by measuring the change in amplitude of the oscillation at a constant frequency just off resonance (amplitude modulation) or by measuring the change in resonant frequency directly using a feedback circuit (usually a phase-locked loop) to always drive the sensor on resonance (frequency modulation).".
- Non-contact_atomic_force_microscopy thumbnail NTCDI_AFM2.jpg?width=300.
- Non-contact_atomic_force_microscopy wikiPageID "40476464".
- Non-contact_atomic_force_microscopy wikiPageLength "25520".
- Non-contact_atomic_force_microscopy wikiPageOutDegree "37".
- Non-contact_atomic_force_microscopy wikiPageRevisionID "705938706".
- Non-contact_atomic_force_microscopy wikiPageWikiLink Atomic-force_microscopy.
- Non-contact_atomic_force_microscopy wikiPageWikiLink Bergman_cyclization.
- Non-contact_atomic_force_microscopy wikiPageWikiLink Cantilever.
- Non-contact_atomic_force_microscopy wikiPageWikiLink Carbon_monoxide.
- Non-contact_atomic_force_microscopy wikiPageWikiLink Category:Intermolecular_forces.
- Non-contact_atomic_force_microscopy wikiPageWikiLink Category:Scanning_probe_microscopy.
- Non-contact_atomic_force_microscopy wikiPageWikiLink Category:Scientific_techniques.
- Non-contact_atomic_force_microscopy wikiPageWikiLink Crosstalk.
- Non-contact_atomic_force_microscopy wikiPageWikiLink Crystal_oscillator.
- Non-contact_atomic_force_microscopy wikiPageWikiLink Doping_(semiconductor).
- Non-contact_atomic_force_microscopy wikiPageWikiLink Franz_Josef_Giessibl.
- Non-contact_atomic_force_microscopy wikiPageWikiLink Harmonic_oscillator.
- Non-contact_atomic_force_microscopy wikiPageWikiLink Liquid_helium.
- Non-contact_atomic_force_microscopy wikiPageWikiLink Magnetic_force_microscope.
- Non-contact_atomic_force_microscopy wikiPageWikiLink Phase-locked_loop.
- Non-contact_atomic_force_microscopy wikiPageWikiLink Phase_(waves).
- Non-contact_atomic_force_microscopy wikiPageWikiLink Piezoelectricity.
- Non-contact_atomic_force_microscopy wikiPageWikiLink Q_factor.
- Non-contact_atomic_force_microscopy wikiPageWikiLink Raster_scan.
- Non-contact_atomic_force_microscopy wikiPageWikiLink Resonance.
- Non-contact_atomic_force_microscopy wikiPageWikiLink Scanning_probe_microscopy.
- Non-contact_atomic_force_microscopy wikiPageWikiLink Scanning_tunneling_microscope.
- Non-contact_atomic_force_microscopy wikiPageWikiLink Stiffness.
- Non-contact_atomic_force_microscopy wikiPageWikiLink Tungsten.
- Non-contact_atomic_force_microscopy wikiPageWikiLink Ultra-high_vacuum.
- Non-contact_atomic_force_microscopy wikiPageWikiLink Van_der_Waals_force.
- Non-contact_atomic_force_microscopy wikiPageWikiLink Ångström.
- Non-contact_atomic_force_microscopy wikiPageWikiLink File:AFM_Amplitude_Modulation.svg.
- Non-contact_atomic_force_microscopy wikiPageWikiLink File:NTCDI_AFM2.jpg.
- Non-contact_atomic_force_microscopy wikiPageWikiLink File:QPlusSchematic.svg.
- Non-contact_atomic_force_microscopy wikiPageWikiLinkText "AFM".
- Non-contact_atomic_force_microscopy wikiPageWikiLinkText "Non-contact AFM".
- Non-contact_atomic_force_microscopy wikiPageWikiLinkText "Non-contact atomic force microscopy".
- Non-contact_atomic_force_microscopy wikiPageWikiLinkText "non-contact atomic force microscopy".
- Non-contact_atomic_force_microscopy wikiPageWikiLinkText "noncontact AFM".
- Non-contact_atomic_force_microscopy wikiPageWikiLinkText "qPlus sensor".
- Non-contact_atomic_force_microscopy wikiPageWikiLinkText "qPlus".
- Non-contact_atomic_force_microscopy wikiPageUsesTemplate Template:Commons_category.
- Non-contact_atomic_force_microscopy wikiPageUsesTemplate Template:Reflist.
- Non-contact_atomic_force_microscopy wikiPageUsesTemplate Template:SPM2.
- Non-contact_atomic_force_microscopy subject Category:Intermolecular_forces.
- Non-contact_atomic_force_microscopy subject Category:Scanning_probe_microscopy.
- Non-contact_atomic_force_microscopy subject Category:Scientific_techniques.
- Non-contact_atomic_force_microscopy hypernym Mode.
- Non-contact_atomic_force_microscopy type Single.
- Non-contact_atomic_force_microscopy comment "Non-contact atomic force microscopy (nc-AFM), also known as dynamic force microscopy (DFM), is a mode of atomic force microscopy, which itself is a type of scanning probe microscopy. In nc-AFM a sharp probe is moved close (order of Angstroms) to the surface under study, the probe is then raster scanned across the surface, the image is then constructed from the force interactions during the scan. The probe is connected to a resonator, usually a silicon cantilever or a quartz crystal resonator.".
- Non-contact_atomic_force_microscopy label "Non-contact atomic force microscopy".
- Non-contact_atomic_force_microscopy sameAs Q16029538.
- Non-contact_atomic_force_microscopy sameAs m.0x16_q5.
- Non-contact_atomic_force_microscopy sameAs Q16029538.
- Non-contact_atomic_force_microscopy wasDerivedFrom Non-contact_atomic_force_microscopy?oldid=705938706.
- Non-contact_atomic_force_microscopy depiction NTCDI_AFM2.jpg.
- Non-contact_atomic_force_microscopy isPrimaryTopicOf Non-contact_atomic_force_microscopy.
