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- MEMS_for_in_situ_mechanical_characterization abstract "MEMS (microelectromechanical systems) for in situ mechanical characterization refers to microfabricated systems (lab-on-a-chip) used to measure the mechanical properties (Young’s modulus, fracture strength) of nanoscale specimens such as nanowires, nanorods, whiskers, nanotubes and thin films. They distinguish themselves from other methods of nanomechanical testing because the sensing and actuation mechanisms are embedded and/or co-fabricated in the microsystem, providing — in the majority of cases— greater sensitivity and precision.This level of integration and miniaturization allows carrying out the mechanical characterization in situ, i.e., testing while observing the evolution of the sample in high magnification instruments such as optical microscopes, scanning electron microscopes (SEM), transmission electron microscopes (TEM) and X-ray setups. Furthermore, analytical capabilities of these instruments such as spectroscopy and diffraction can be used to further characterize the sample, providing a complete picture of the evolution of the specimen as it is loaded and fails. Owing to the development of mature MEMS microfabrication technologies, the use of these microsystems for research purposes has been increasing in recent years.Most of the current developments aim to implement in situ mechanical testing coupled with other type of measurements, such as electrical or thermal, and to extend the range of samples tested to the biological domain, testing specimens such as cells and collagen fibrils.".
- MEMS_for_in_situ_mechanical_characterization thumbnail MEMS_In_Situ_TEM_Device.png?width=300.
- MEMS_for_in_situ_mechanical_characterization wikiPageID "31894500".
- MEMS_for_in_situ_mechanical_characterization wikiPageLength "14653".
- MEMS_for_in_situ_mechanical_characterization wikiPageOutDegree "21".
- MEMS_for_in_situ_mechanical_characterization wikiPageRevisionID "632044347".
- MEMS_for_in_situ_mechanical_characterization wikiPageWikiLink Atomic-force_microscopy.
- MEMS_for_in_situ_mechanical_characterization wikiPageWikiLink Category:Nanotechnology.
- MEMS_for_in_situ_mechanical_characterization wikiPageWikiLink Diffraction.
- MEMS_for_in_situ_mechanical_characterization wikiPageWikiLink File:MEMS_In_Situ_TEM_Device.png.
- MEMS_for_in_situ_mechanical_characterization wikiPageWikiLink Fracture.
- MEMS_for_in_situ_mechanical_characterization wikiPageWikiLink Johns_Hopkins_University.
- MEMS_for_in_situ_mechanical_characterization wikiPageWikiLink Lab-on-a-chip.
- MEMS_for_in_situ_mechanical_characterization wikiPageWikiLink Microelectromechanical_systems.
- MEMS_for_in_situ_mechanical_characterization wikiPageWikiLink Microfabrication.
- MEMS_for_in_situ_mechanical_characterization wikiPageWikiLink Microscope.
- MEMS_for_in_situ_mechanical_characterization wikiPageWikiLink Microsystem.
- MEMS_for_in_situ_mechanical_characterization wikiPageWikiLink Nanorod.
- MEMS_for_in_situ_mechanical_characterization wikiPageWikiLink Nanoscopic_scale.
- MEMS_for_in_situ_mechanical_characterization wikiPageWikiLink Nanowire.
- MEMS_for_in_situ_mechanical_characterization wikiPageWikiLink Northwestern_University.
- MEMS_for_in_situ_mechanical_characterization wikiPageWikiLink Scanning_electron_microscope.
- MEMS_for_in_situ_mechanical_characterization wikiPageWikiLink Spectroscopy.
- MEMS_for_in_situ_mechanical_characterization wikiPageWikiLink Thin_film.
- MEMS_for_in_situ_mechanical_characterization wikiPageWikiLink Transmission_electron_microscopy.
- MEMS_for_in_situ_mechanical_characterization wikiPageWikiLink Universal_testing_machine.
- MEMS_for_in_situ_mechanical_characterization wikiPageWikiLink Youngs_modulus.
- MEMS_for_in_situ_mechanical_characterization wikiPageWikiLinkText "MEMS for in situ mechanical characterization".
- MEMS_for_in_situ_mechanical_characterization wikiPageUsesTemplate Template:Reflist.
- MEMS_for_in_situ_mechanical_characterization subject Category:Nanotechnology.
- MEMS_for_in_situ_mechanical_characterization type Physic.
- MEMS_for_in_situ_mechanical_characterization comment "MEMS (microelectromechanical systems) for in situ mechanical characterization refers to microfabricated systems (lab-on-a-chip) used to measure the mechanical properties (Young’s modulus, fracture strength) of nanoscale specimens such as nanowires, nanorods, whiskers, nanotubes and thin films.".
- MEMS_for_in_situ_mechanical_characterization label "MEMS for in situ mechanical characterization".
- MEMS_for_in_situ_mechanical_characterization sameAs Q17156536.
- MEMS_for_in_situ_mechanical_characterization sameAs m.0gvt3zm.
- MEMS_for_in_situ_mechanical_characterization sameAs Q17156536.
- MEMS_for_in_situ_mechanical_characterization wasDerivedFrom MEMS_for_in_situ_mechanical_characterization?oldid=632044347.
- MEMS_for_in_situ_mechanical_characterization depiction MEMS_In_Situ_TEM_Device.png.
- MEMS_for_in_situ_mechanical_characterization isPrimaryTopicOf MEMS_for_in_situ_mechanical_characterization.
