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- Low-energy_electron_microscopy abstract "Low-energy electron microscopy, or LEEM, is an analytical surface science technique invented by Ernst Bauer in 1962, however, not fully developed (by Ernst Bauer and Wolfgang Telieps) until 1985. LEEM is a technique used by surface scientists to image atomically clean surfaces, atom-surface interactions, and thin (crystalline) films. In LEEM, high-energy electrons (15-20 keV) are emitted from an electron gun, focused using a set of condenser optics, and sent through a magnetic beam deflector (usually 60˚ or 90˚). The “fast” electrons travel through an objective lens and begin decelerating to low energies (1-100 eV) near the sample surface because the sample is held at a potential near that of the gun. The low-energy electrons are now termed “surface-sensitive” and the near-surface sampling depth can be varied by tuning the energy of the incident electrons (difference between the sample and gun potentials minus the work functions of the sample and system). The low-energy elastically backscattered electrons travel back through the objective lens, reaccelerate to the gun voltage (because the objective lens is grounded), and pass through the beam separator again. However, now the electrons travel away from the condenser optics and into the projector lenses. Imaging of the back focal plane of the objective lens into the object plane of the projector lens (using an intermediate lens) produces a diffraction pattern (low-energy electron diffraction, LEED) at the imaging plane and recorded in a number of different ways. The intensity distribution of the diffraction pattern will depend on the periodicity at the sample surface and is a direct result of the wave nature of the electrons. One can produce individual images of the diffraction pattern spot intensities by turning off the intermediate lens and inserting a contrast aperture in the back focal plane of the objective lens (or, in state-of-the-art instruments, in the center of the separator, as chosen by the excitation of the objective lens), thus allowing for real-time observations of dynamic processes at surfaces. Such phenomena include (but are not limited to): tomography, phase transitions, adsorption, reaction, segregation, thin film growth, etching, strain relief, sublimation, and magnetic microstructure. These investigations are only possible because of the accessibility of the sample; allowing for a wide variety of in situ studies over a wide temperature range.".
- Low-energy_electron_microscopy thumbnail UIUC_LEEM.jpg?width=300.
- Low-energy_electron_microscopy wikiPageExternalLink 1.
- Low-energy_electron_microscopy wikiPageExternalLink www.leem-user.com.
- Low-energy_electron_microscopy wikiPageID "11248623".
- Low-energy_electron_microscopy wikiPageLength "15984".
- Low-energy_electron_microscopy wikiPageOutDegree "16".
- Low-energy_electron_microscopy wikiPageRevisionID "647925455".
- Low-energy_electron_microscopy wikiPageWikiLink Category:Electron_microscopy.
- Low-energy_electron_microscopy wikiPageWikiLink Category:Scientific_techniques.
- Low-energy_electron_microscopy wikiPageWikiLink Diffraction.
- Low-energy_electron_microscopy wikiPageWikiLink Electron_gun.
- Low-energy_electron_microscopy wikiPageWikiLink Ernst_G._Bauer.
- Low-energy_electron_microscopy wikiPageWikiLink File:EwaldsphereLEED.png.
- Low-energy_electron_microscopy wikiPageWikiLink Low-energy_electron_diffraction.
- Low-energy_electron_microscopy wikiPageWikiLink Surface_Review_and_Letters.
- Low-energy_electron_microscopy wikiPageWikiLink Surface_science.
- Low-energy_electron_microscopy wikiPageWikiLink Work_function.
- Low-energy_electron_microscopy wikiPageWikiLink File:Ag_rods_on_Si.png.
- Low-energy_electron_microscopy wikiPageWikiLink File:Cr(001).png.
- Low-energy_electron_microscopy wikiPageWikiLink File:LEED_Lens_and_Ray_Diagram.png.
- Low-energy_electron_microscopy wikiPageWikiLink File:LEEM_palladium_on_tungsten.jpg.
- Low-energy_electron_microscopy wikiPageWikiLink File:UIUC_LEEM.jpg.
- Low-energy_electron_microscopy wikiPageWikiLinkText "LEEM".
- Low-energy_electron_microscopy wikiPageWikiLinkText "Low-energy electron microscopy".
- Low-energy_electron_microscopy wikiPageWikiLinkText "Low-energy electron microscopy#Spin-polarized LEEM (SPLEEM)".
- Low-energy_electron_microscopy wikiPageWikiLinkText "dark field imaging".
- Low-energy_electron_microscopy wikiPageUsesTemplate Template:Cite_journal.
- Low-energy_electron_microscopy wikiPageUsesTemplate Template:Main.
- Low-energy_electron_microscopy wikiPageUsesTemplate Template:Reflist.
- Low-energy_electron_microscopy subject Category:Electron_microscopy.
- Low-energy_electron_microscopy subject Category:Scientific_techniques.
- Low-energy_electron_microscopy hypernym Technique.
- Low-energy_electron_microscopy type TopicalConcept.
- Low-energy_electron_microscopy type Redirect.
- Low-energy_electron_microscopy type Technique.
- Low-energy_electron_microscopy comment "Low-energy electron microscopy, or LEEM, is an analytical surface science technique invented by Ernst Bauer in 1962, however, not fully developed (by Ernst Bauer and Wolfgang Telieps) until 1985. LEEM is a technique used by surface scientists to image atomically clean surfaces, atom-surface interactions, and thin (crystalline) films.".
- Low-energy_electron_microscopy label "Low-energy electron microscopy".
- Low-energy_electron_microscopy sameAs Q908748.
- Low-energy_electron_microscopy sameAs Niederenergetisches_Elektronenmikroskop.
- Low-energy_electron_microscopy sameAs m.02r50rb.
- Low-energy_electron_microscopy sameAs Микроскопия_медленных_электронов.
- Low-energy_electron_microscopy sameAs Düşük_enerjili_elektron_mikroskobu.
- Low-energy_electron_microscopy sameAs Q908748.
- Low-energy_electron_microscopy wasDerivedFrom Low-energy_electron_microscopy?oldid=647925455.
- Low-energy_electron_microscopy depiction UIUC_LEEM.jpg.
- Low-energy_electron_microscopy isPrimaryTopicOf Low-energy_electron_microscopy.