Matches in DBpedia 2016-04 for { <http://citation.dbpedia.org/hash/d2ca649738fc2d3164b74aaeef6b6aee740691e6739e47af5cccd503b9938abd> ?p ?o }
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- d2ca649738fc2d3164b74aaeef6b6aee740691e6739e47af5cccd503b9938abd author2 "Krishnakumar, A.S.".
- d2ca649738fc2d3164b74aaeef6b6aee740691e6739e47af5cccd503b9938abd booktitle "International Design Automation Conference".
- d2ca649738fc2d3164b74aaeef6b6aee740691e6739e47af5cccd503b9938abd first "K-T".
- d2ca649738fc2d3164b74aaeef6b6aee740691e6739e47af5cccd503b9938abd isCitedBy Extended_finite-state_machine.
- d2ca649738fc2d3164b74aaeef6b6aee740691e6739e47af5cccd503b9938abd last "Cheng".
- d2ca649738fc2d3164b74aaeef6b6aee740691e6739e47af5cccd503b9938abd pages "86–91".
- d2ca649738fc2d3164b74aaeef6b6aee740691e6739e47af5cccd503b9938abd publisher "ACM".
- d2ca649738fc2d3164b74aaeef6b6aee740691e6739e47af5cccd503b9938abd title "Automatic Functional Test Generation Using The Extended Finite State Machine Model".
- d2ca649738fc2d3164b74aaeef6b6aee740691e6739e47af5cccd503b9938abd year "1993".