Matches in DBpedia 2016-04 for { ?s ?p <http://dbpedia.org/resource/Automatic_test_pattern_generation> }
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- ATPG wikiPageRedirects Automatic_test_pattern_generation.
- Automatic_Test_Pattern_Generation wikiPageRedirects Automatic_test_pattern_generation.
- ATPG wikiPageWikiLink Automatic_test_pattern_generation.
- Automatic_Test_Pattern_Generation wikiPageWikiLink Automatic_test_pattern_generation.
- Automatic_test_equipment wikiPageWikiLink Automatic_test_pattern_generation.
- Boolean_satisfiability_problem wikiPageWikiLink Automatic_test_pattern_generation.
- Clique_(graph_theory) wikiPageWikiLink Automatic_test_pattern_generation.
- Design_for_testing wikiPageWikiLink Automatic_test_pattern_generation.
- Digital_electronics wikiPageWikiLink Automatic_test_pattern_generation.
- Electronic_design_automation wikiPageWikiLink Automatic_test_pattern_generation.
- Failure_analysis wikiPageWikiLink Automatic_test_pattern_generation.
- Fault_coverage wikiPageWikiLink Automatic_test_pattern_generation.
- Fault_grading wikiPageWikiLink Automatic_test_pattern_generation.
- Fault_model wikiPageWikiLink Automatic_test_pattern_generation.
- Ila wikiPageWikiLink Automatic_test_pattern_generation.
- Integrated_circuit wikiPageWikiLink Automatic_test_pattern_generation.
- Integrated_circuit_design wikiPageWikiLink Automatic_test_pattern_generation.
- Prabhu_Goel wikiPageWikiLink Automatic_test_pattern_generation.
- Scan_chain wikiPageWikiLink Automatic_test_pattern_generation.
- Stuck-at_fault wikiPageWikiLink Automatic_test_pattern_generation.
- Test_compression wikiPageWikiLink Automatic_test_pattern_generation.
- Transputer wikiPageWikiLink Automatic_test_pattern_generation.
- Wafer_testing wikiPageWikiLink Automatic_test_pattern_generation.
- books?vid=ISBN0-87170-804-3 isCitedBy Automatic_test_pattern_generation.
- e7109dd14a2dd04747721260c4be1d0b4b68f3282d8be6d1c46e45553a24f0bf isCitedBy Automatic_test_pattern_generation.
- Automatic_test_pattern_generation primaryTopic Automatic_test_pattern_generation.