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- Total_internal_reflection_microscopy abstract "Total internal reflection microscopy is a specialized optical imaging technique for object tracking and detection utilizing the light scattered from an evanescent field in the vicinity of a dielectric interface. Its advantages are a high signal-to-noise ratio and a high spatial resolution in the vertical dimension.".
- Total_internal_reflection_microscopy thumbnail Total_internal_reflection_scattering.svg?width=300.
- Total_internal_reflection_microscopy wikiPageID "27133674".
- Total_internal_reflection_microscopy wikiPageLength "4713".
- Total_internal_reflection_microscopy wikiPageOutDegree "20".
- Total_internal_reflection_microscopy wikiPageRevisionID "627284997".
- Total_internal_reflection_microscopy wikiPageWikiLink Boltzmann_constant.
- Total_internal_reflection_microscopy wikiPageWikiLink Category:Microscopy.
- Total_internal_reflection_microscopy wikiPageWikiLink Dark-field_microscopy.
- Total_internal_reflection_microscopy wikiPageWikiLink Dark_field_microscopy.
- Total_internal_reflection_microscopy wikiPageWikiLink Dielectric.
- Total_internal_reflection_microscopy wikiPageWikiLink Diffusion.
- Total_internal_reflection_microscopy wikiPageWikiLink Evanescent_field.
- Total_internal_reflection_microscopy wikiPageWikiLink Evanescent_wave.
- Total_internal_reflection_microscopy wikiPageWikiLink Maxwell–Boltzmann_distribution.
- Total_internal_reflection_microscopy wikiPageWikiLink Partition_function_(statistical_mechanics).
- Total_internal_reflection_microscopy wikiPageWikiLink Signal-to-noise_ratio.
- Total_internal_reflection_microscopy wikiPageWikiLink Single_particle_tracking.
- Total_internal_reflection_microscopy wikiPageWikiLink Total_internal_reflection.
- Total_internal_reflection_microscopy wikiPageWikiLink Total_internal_reflection_fluorescence_microscope.
- Total_internal_reflection_microscopy wikiPageWikiLink Total_internal_reflection_fluorescence_microscopy.
- Total_internal_reflection_microscopy wikiPageWikiLink File:Total_internal_reflection_scattering.svg.
- Total_internal_reflection_microscopy wikiPageWikiLinkText "Total internal reflection microscopy".
- Total_internal_reflection_microscopy hasPhotoCollection Total_internal_reflection_microscopy.
- Total_internal_reflection_microscopy wikiPageUsesTemplate Template:Reflist.
- Total_internal_reflection_microscopy subject Category:Microscopy.
- Total_internal_reflection_microscopy hypernym Technique.
- Total_internal_reflection_microscopy type Software.
- Total_internal_reflection_microscopy comment "Total internal reflection microscopy is a specialized optical imaging technique for object tracking and detection utilizing the light scattered from an evanescent field in the vicinity of a dielectric interface. Its advantages are a high signal-to-noise ratio and a high spatial resolution in the vertical dimension.".
- Total_internal_reflection_microscopy label "Total internal reflection microscopy".
- Total_internal_reflection_microscopy sameAs m.011x537x.
- Total_internal_reflection_microscopy sameAs Q18353600.
- Total_internal_reflection_microscopy sameAs Q18353600.
- Total_internal_reflection_microscopy wasDerivedFrom Total_internal_reflection_microscopy?oldid=627284997.
- Total_internal_reflection_microscopy depiction Total_internal_reflection_scattering.svg.
- Total_internal_reflection_microscopy isPrimaryTopicOf Total_internal_reflection_microscopy.
