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- Time-resolved_photon_emission abstract "Time-resolved photon emission (TRPE) is used to measure timing waveforms on semiconductor devices. TRPE measurements are performed on the back side of the semiconductor device. The substrate of the device-under-test (DUT) must first be thinned mechanically. The device is mounted on a movable X-Y stage in an enclosure which shields it from all sources of light. The DUT is connected to an active electrical stimulus. The stimulus pattern is continuously looped and a trigger signal is sent to the TRPE instrument in order to tell it when the pattern repeats. A TRPE prober operates in a manner similar to a sampling oscilloscope, and is used to perform semiconductor failure analysis.".
- Time-resolved_photon_emission wikiPageID "8504677".
- Time-resolved_photon_emission wikiPageLength "2218".
- Time-resolved_photon_emission wikiPageOutDegree "7".
- Time-resolved_photon_emission wikiPageRevisionID "618605012".
- Time-resolved_photon_emission wikiPageWikiLink Category:Semiconductor_analysis.
- Time-resolved_photon_emission wikiPageWikiLink Failure_analysis.
- Time-resolved_photon_emission wikiPageWikiLink Histogram.
- Time-resolved_photon_emission wikiPageWikiLink Logic_gate.
- Time-resolved_photon_emission wikiPageWikiLink Logic_gates.
- Time-resolved_photon_emission wikiPageWikiLink MOSFET.
- Time-resolved_photon_emission wikiPageWikiLink Photon.
- Time-resolved_photon_emission wikiPageWikiLinkText "Time-resolved photon emission".
- Time-resolved_photon_emission hasPhotoCollection Time-resolved_photon_emission.
- Time-resolved_photon_emission wikiPageUsesTemplate Template:Cite_conference.
- Time-resolved_photon_emission wikiPageUsesTemplate Template:Tech-stub.
- Time-resolved_photon_emission subject Category:Semiconductor_analysis.
- Time-resolved_photon_emission type Semiconductor.
- Time-resolved_photon_emission comment "Time-resolved photon emission (TRPE) is used to measure timing waveforms on semiconductor devices. TRPE measurements are performed on the back side of the semiconductor device. The substrate of the device-under-test (DUT) must first be thinned mechanically. The device is mounted on a movable X-Y stage in an enclosure which shields it from all sources of light. The DUT is connected to an active electrical stimulus.".
- Time-resolved_photon_emission label "Time-resolved photon emission".
- Time-resolved_photon_emission sameAs m.0275v_y.
- Time-resolved_photon_emission sameAs Q7804829.
- Time-resolved_photon_emission sameAs Q7804829.
- Time-resolved_photon_emission wasDerivedFrom Time-resolved_photon_emission?oldid=618605012.
- Time-resolved_photon_emission isPrimaryTopicOf Time-resolved_photon_emission.