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- Scanning_joule_expansion_microscopy abstract "Scanning Joule Expansion Microscopy is a form of scanning probe microscopy heavily based on atomic force microscopy that maps the temperature distribution along a surface. Resolutions down to 10 nm have been achieved and 1 nm resolution is theoretically possible. Thermal measurements at the nanometer scale are of both academic and industrial interest, particularly in regards to nanomaterials and modern integrated circuits.".
- Scanning_joule_expansion_microscopy thumbnail SJEM_schematic.png?width=300.
- Scanning_joule_expansion_microscopy wikiPageID "29427548".
- Scanning_joule_expansion_microscopy wikiPageLength "18235".
- Scanning_joule_expansion_microscopy wikiPageOutDegree "9".
- Scanning_joule_expansion_microscopy wikiPageRevisionID "597299145".
- Scanning_joule_expansion_microscopy wikiPageWikiLink Atomic_force_microscopy.
- Scanning_joule_expansion_microscopy wikiPageWikiLink Category:Scanning_probe_microscopy.
- Scanning_joule_expansion_microscopy wikiPageWikiLink Category:Scientific_techniques.
- Scanning_joule_expansion_microscopy wikiPageWikiLink Category:Semiconductor_analysis.
- Scanning_joule_expansion_microscopy wikiPageWikiLink Integrated_circuit.
- Scanning_joule_expansion_microscopy wikiPageWikiLink Integrated_circuits.
- Scanning_joule_expansion_microscopy wikiPageWikiLink Nanomaterials.
- Scanning_joule_expansion_microscopy wikiPageWikiLink Nanometre.
- Scanning_joule_expansion_microscopy wikiPageWikiLink Scanning_probe_microscopy.
- Scanning_joule_expansion_microscopy wikiPageWikiLink File:SJEM_schematic.png.
- Scanning_joule_expansion_microscopy wikiPageWikiLinkText "scanning joule expansion microscopy".
- Scanning_joule_expansion_microscopy hasPhotoCollection Scanning_joule_expansion_microscopy.
- Scanning_joule_expansion_microscopy wikiPageUsesTemplate Template:Orphan.
- Scanning_joule_expansion_microscopy wikiPageUsesTemplate Template:Reflist.
- Scanning_joule_expansion_microscopy subject Category:Scanning_probe_microscopy.
- Scanning_joule_expansion_microscopy subject Category:Scientific_techniques.
- Scanning_joule_expansion_microscopy subject Category:Semiconductor_analysis.
- Scanning_joule_expansion_microscopy hypernym Form.
- Scanning_joule_expansion_microscopy type Article.
- Scanning_joule_expansion_microscopy type Article.
- Scanning_joule_expansion_microscopy type Semiconductor.
- Scanning_joule_expansion_microscopy type Technique.
- Scanning_joule_expansion_microscopy comment "Scanning Joule Expansion Microscopy is a form of scanning probe microscopy heavily based on atomic force microscopy that maps the temperature distribution along a surface. Resolutions down to 10 nm have been achieved and 1 nm resolution is theoretically possible. Thermal measurements at the nanometer scale are of both academic and industrial interest, particularly in regards to nanomaterials and modern integrated circuits.".
- Scanning_joule_expansion_microscopy label "Scanning joule expansion microscopy".
- Scanning_joule_expansion_microscopy sameAs m.0ds31gq.
- Scanning_joule_expansion_microscopy sameAs Q7430069.
- Scanning_joule_expansion_microscopy sameAs Q7430069.
- Scanning_joule_expansion_microscopy wasDerivedFrom Scanning_joule_expansion_microscopy?oldid=597299145.
- Scanning_joule_expansion_microscopy depiction SJEM_schematic.png.
- Scanning_joule_expansion_microscopy isPrimaryTopicOf Scanning_joule_expansion_microscopy.