Matches in DBpedia 2015-10 for { <http://dbpedia.org/resource/Mask_inspection> ?p ?o }
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- Mask_inspection abstract "In microtechnology, mask inspection or photomask inspection is an operation of checking the correctness of the fabricated photomasks, used, e.g., for semiconductor device fabrication.Modern technologies for locating defects in photomasks are automated systems that involve scanning electron microscopy and other advanced tools.".
- Mask_inspection wikiPageID "24988101".
- Mask_inspection wikiPageLength "1545".
- Mask_inspection wikiPageOutDegree "5".
- Mask_inspection wikiPageRevisionID "519800316".
- Mask_inspection wikiPageWikiLink Category:Microtechnology.
- Mask_inspection wikiPageWikiLink Microtechnology.
- Mask_inspection wikiPageWikiLink Photomask.
- Mask_inspection wikiPageWikiLink Scanning_electron_microscope.
- Mask_inspection wikiPageWikiLink Scanning_electron_microscopy.
- Mask_inspection wikiPageWikiLink Semiconductor_device_fabrication.
- Mask_inspection wikiPageWikiLinkText "Mask inspection".
- Mask_inspection wikiPageWikiLinkText "mask inspection".
- Mask_inspection hasPhotoCollection Mask_inspection.
- Mask_inspection wikiPageUsesTemplate Template:Electronics-stub.
- Mask_inspection wikiPageUsesTemplate Template:Reflist.
- Mask_inspection subject Category:Microtechnology.
- Mask_inspection hypernym Operation.
- Mask_inspection type MilitaryConflict.
- Mask_inspection comment "In microtechnology, mask inspection or photomask inspection is an operation of checking the correctness of the fabricated photomasks, used, e.g., for semiconductor device fabrication.Modern technologies for locating defects in photomasks are automated systems that involve scanning electron microscopy and other advanced tools.".
- Mask_inspection label "Mask inspection".
- Mask_inspection sameAs m.09ggbmt.
- Mask_inspection sameAs Q6783372.
- Mask_inspection sameAs Q6783372.
- Mask_inspection wasDerivedFrom Mask_inspection?oldid=519800316.
- Mask_inspection isPrimaryTopicOf Mask_inspection.