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- Feature-oriented_scanning abstract "Feature-oriented scanning (FOS) is a method of precision measurement of surface topography with a scanning probe microscope in which surface features (objects) are used as reference points for microscope probe attachment. With FOS method, by passing from one surface feature to another located nearby, the relative distance between the features and the feature neighborhood topographies are measured. This approach allows to scan an intended area of a surface by parts and then reconstruct the whole image from the obtained fragments. Beside the mentioned, it is acceptable to use another name for the method – object-oriented scanning (OOS).Any topography element that looks like a hill or a pit in wide sense may be taken as a surface feature. Examples of surface features (objects) are: atoms, interstices, molecules, grains, nanoparticles, clusters, crystallites, quantum dots, nanoislets, pillars, pores, short nanowires, short nanorods, short nanotubes, viruses, bacteria, organelles, cells, etc.FOS is designed for high-precision measurement of surface topography (see Fig.) as well as other surface properties and characteristics. Moreover, in comparison with the conventional scanning, FOS allows obtaining a higher spatial resolution. Thanks to a number of techniques embedded in FOS, the distortions caused by thermal drifts and creeps are practically eliminated.FOS has the following fields of application: surface metrology, precise probe positioning, automatic surface characterization, automatic surface modification/stimulation, automatic manipulation of nanoobjects, nanotechnological processes of "bottom-up" assembly, coordinated control of analytical and technological probes in multiprobe instruments, control of atomic/molecular assemblers, control of probe nanolithographs, etc.".
- Feature-oriented_scanning thumbnail R._V._Lapshin,_Feature-oriented_scanning_(FOS),_Fig._1.png?width=300.
- Feature-oriented_scanning wikiPageExternalLink fos1996.
- Feature-oriented_scanning wikiPageID "8984619".
- Feature-oriented_scanning wikiPageLength "6730".
- Feature-oriented_scanning wikiPageOutDegree "23".
- Feature-oriented_scanning wikiPageRevisionID "655161243".
- Feature-oriented_scanning wikiPageWikiLink Atom.
- Feature-oriented_scanning wikiPageWikiLink Bacteria.
- Feature-oriented_scanning wikiPageWikiLink Bacterium.
- Feature-oriented_scanning wikiPageWikiLink Category:Microscopes.
- Feature-oriented_scanning wikiPageWikiLink Category:Scanning_probe_microscopy.
- Feature-oriented_scanning wikiPageWikiLink Cell_(biology).
- Feature-oriented_scanning wikiPageWikiLink Counter-scanning.
- Feature-oriented_scanning wikiPageWikiLink Creep_(deformation).
- Feature-oriented_scanning wikiPageWikiLink Crystallite.
- Feature-oriented_scanning wikiPageWikiLink Feature-oriented_positioning.
- Feature-oriented_scanning wikiPageWikiLink Interstitial_fluid.
- Feature-oriented_scanning wikiPageWikiLink Interstitial_space_(biology).
- Feature-oriented_scanning wikiPageWikiLink Metrology.
- Feature-oriented_scanning wikiPageWikiLink Molecular_assembler.
- Feature-oriented_scanning wikiPageWikiLink Molecule.
- Feature-oriented_scanning wikiPageWikiLink Nanolithograph.
- Feature-oriented_scanning wikiPageWikiLink Nanoparticle.
- Feature-oriented_scanning wikiPageWikiLink Nanotube.
- Feature-oriented_scanning wikiPageWikiLink Nanowire.
- Feature-oriented_scanning wikiPageWikiLink Organelle.
- Feature-oriented_scanning wikiPageWikiLink Quantum_dot.
- Feature-oriented_scanning wikiPageWikiLink Scanning_probe_microscope.
- Feature-oriented_scanning wikiPageWikiLink Scanning_probe_microscopy.
- Feature-oriented_scanning wikiPageWikiLink Virus.
- Feature-oriented_scanning wikiPageWikiLink File:R._V._Lapshin,_Feature-oriented_scanning_(FOS),_Fig._1.png.
- Feature-oriented_scanning wikiPageWikiLinkText "Feature-oriented scanning".
- Feature-oriented_scanning wikiPageWikiLinkText "feature-oriented scanning probe microscopy".
- Feature-oriented_scanning wikiPageWikiLinkText "feature-oriented scanning".
- Feature-oriented_scanning hasPhotoCollection Feature-oriented_scanning.
- Feature-oriented_scanning wikiPageUsesTemplate Template:Disambiguation_needed.
- Feature-oriented_scanning wikiPageUsesTemplate Template:Scanning_probe_microscopy.
- Feature-oriented_scanning subject Category:Microscopes.
- Feature-oriented_scanning subject Category:Scanning_probe_microscopy.
- Feature-oriented_scanning hypernym Method.
- Feature-oriented_scanning type Instrument.
- Feature-oriented_scanning type Software.
- Feature-oriented_scanning type Instrument.
- Feature-oriented_scanning type Physic.
- Feature-oriented_scanning comment "Feature-oriented scanning (FOS) is a method of precision measurement of surface topography with a scanning probe microscope in which surface features (objects) are used as reference points for microscope probe attachment. With FOS method, by passing from one surface feature to another located nearby, the relative distance between the features and the feature neighborhood topographies are measured.".
- Feature-oriented_scanning label "Feature-oriented scanning".
- Feature-oriented_scanning sameAs m.027s8yj.
- Feature-oriented_scanning sameAs Особенность-ориентированное_сканирование.
- Feature-oriented_scanning sameAs Q4338202.
- Feature-oriented_scanning sameAs Q4338202.
- Feature-oriented_scanning wasDerivedFrom Feature-oriented_scanning?oldid=655161243.
- Feature-oriented_scanning depiction R._V._Lapshin,_Feature-oriented_scanning_(FOS),_Fig._1.png.
- Feature-oriented_scanning isPrimaryTopicOf Feature-oriented_scanning.