Matches in DBpedia 2015-10 for { <http://dbpedia.org/resource/Feature-oriented_positioning> ?p ?o }
Showing triples 1 to 40 of
40
with 100 triples per page.
- Feature-oriented_positioning abstract "Feature-oriented positioning (FOP) is a method of precise movement of the scanning microscope probe across the surface under investigation. With this method, surface features (objects) are used as reference points for microscope probe attachment. Actually, FOP is a simplified variant of the feature-oriented scanning (FOS). With FOP, no topographical image of a surface is acquired. Instead, a probe movement by surface features is only carried out from the start surface point A (neighborhood of the start feature) to the destination point B (neighborhood of the destination feature) along some route that goes through intermediate features of the surface. The method may also be referred to by another name — object-oriented positioning (OOP).To be distinguished are a "blind" FOP when the coordinates of features used for probe movement are unknown in advance and FOP by existing feature "map" when the relative coordinates of all features are known, for example, in case they were obtained during preliminary FOS. Probe movement by a navigation structure is a combination of the above-pointed methods.FOP method may be used in bottom-up nanofabrication to implement high-precision movement of the nanolithograph/nanoassembler probe along the substrate surface. Moreover, once made along some route, FOP may be then exactly repeated the required number of times. After movement in the specified position, an influence on the surface or manipulation of a surface object (nanoparticle, molecule, atom) is performed. All the operations are carried out in automatic mode. With multiprobe instruments, FOP approach allows to apply any number of specialized technological and/or analytical probes successively to a surface feature/object or to a specified point of the feature/object neighborhood. That opens a prospect for building a complex nanofabrication consisting of a large number of technological, measuring, and checking operations.".
- Feature-oriented_positioning wikiPageExternalLink fop1996.
- Feature-oriented_positioning wikiPageID "9590785".
- Feature-oriented_positioning wikiPageLength "4513".
- Feature-oriented_positioning wikiPageOutDegree "13".
- Feature-oriented_positioning wikiPageRevisionID "655161265".
- Feature-oriented_positioning wikiPageWikiLink Atom.
- Feature-oriented_positioning wikiPageWikiLink Category:Microscopes.
- Feature-oriented_positioning wikiPageWikiLink Category:Nanotechnology.
- Feature-oriented_positioning wikiPageWikiLink Feature-oriented_scanning.
- Feature-oriented_positioning wikiPageWikiLink Molecular_assembler.
- Feature-oriented_positioning wikiPageWikiLink Molecule.
- Feature-oriented_positioning wikiPageWikiLink Nanoassembler.
- Feature-oriented_positioning wikiPageWikiLink Nanofabrication.
- Feature-oriented_positioning wikiPageWikiLink Nanolithograph.
- Feature-oriented_positioning wikiPageWikiLink Nanolithography.
- Feature-oriented_positioning wikiPageWikiLink Nanoparticle.
- Feature-oriented_positioning wikiPageWikiLink Scanning_probe_microscope.
- Feature-oriented_positioning wikiPageWikiLink Scanning_probe_microscopy.
- Feature-oriented_positioning wikiPageWikiLink Category:Scanning_atomic-force_microscope.
- Feature-oriented_positioning wikiPageWikiLink Category:Scanning_probe_microscope.
- Feature-oriented_positioning wikiPageWikiLinkText "Feature-oriented positioning".
- Feature-oriented_positioning hasPhotoCollection Feature-oriented_positioning.
- Feature-oriented_positioning wikiPageUsesTemplate Template:Scanning_probe_microscopy.
- Feature-oriented_positioning subject Category:Microscopes.
- Feature-oriented_positioning subject Category:Nanotechnology.
- Feature-oriented_positioning subject Category:Scanning_atomic-force_microscope.
- Feature-oriented_positioning subject Category:Scanning_probe_microscope.
- Feature-oriented_positioning hypernym Method.
- Feature-oriented_positioning type Instrument.
- Feature-oriented_positioning type Software.
- Feature-oriented_positioning type Instrument.
- Feature-oriented_positioning type Physic.
- Feature-oriented_positioning comment "Feature-oriented positioning (FOP) is a method of precise movement of the scanning microscope probe across the surface under investigation. With this method, surface features (objects) are used as reference points for microscope probe attachment. Actually, FOP is a simplified variant of the feature-oriented scanning (FOS). With FOP, no topographical image of a surface is acquired.".
- Feature-oriented_positioning label "Feature-oriented positioning".
- Feature-oriented_positioning sameAs m.012brk6m.
- Feature-oriented_positioning sameAs Q19904144.
- Feature-oriented_positioning sameAs Q19904144.
- Feature-oriented_positioning wasDerivedFrom Feature-oriented_positioning?oldid=655161265.
- Feature-oriented_positioning isPrimaryTopicOf Feature-oriented_positioning.