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Matches in DBpedia 2015-10 for { <http://dbpedia.org/resource/Failure_modes_of_electronics> ?p ?o }

• Failure_modes_of_electronics abstract "Electronic components have a wide range of failure modes. These can be classified in various ways, such as by time or cause. Failures can be caused by excess temperature, excess current or voltage, ionizing radiation, mechanical shock, stress or impact, and many other causes. In semiconductor devices, problems in the device package may cause failures due to contamination, mechanical stress of the device, or open or short circuits.Failures most commonly occur near the beginning and near the ending of the lifetime of the parts, resulting in the bathtub curve graph of failure rates. Burn-in procedures are used to detect early failures. In semiconductor devices, parasitic structures, irrelevant for normal operation, become important in the context of failures; they can be both a source and protection against failure.Applications such as aerospace systems, life support systems, telecommunications, railway signals, and computers use great numbers of individual electronic components. Analysis of the statistical properties of failures can give guidance in designs to establish a given level of reliability. For example, power-handling ability of a resistor may be greatly derated when applied in high-altitude aircraft to obtain adequate service life.A sudden fail-open fault can cause multiple secondary failures if it is fast and the circuit contains an inductance; this causes large voltage spikes, which may exceed 500 volts. A broken metallisation on a chip may thus cause secondary overvoltage damage. Thermal runaway can cause sudden failures including melting, fire or explosions.".
• Failure_modes_of_electronics thumbnail Failed_SMPS_controller_IC_ISL6251.jpg?width=300.
• Failure_modes_of_electronics wikiPageID "26626178".
• Failure_modes_of_electronics wikiPageLength "39810".
• Failure_modes_of_electronics wikiPageOutDegree "143".
• Failure_modes_of_electronics wikiPageRevisionID "660976085".
• Failure_modes_of_electronics wikiPageWikiLink Alkali_metal.
• Failure_modes_of_electronics wikiPageWikiLink Allotropes_of_phosphorus.
• Failure_modes_of_electronics wikiPageWikiLink Aluminium_gallium_arsenide.
• Failure_modes_of_electronics wikiPageWikiLink Aluminium_hydroxide.
• Failure_modes_of_electronics wikiPageWikiLink Ammonia.
• Failure_modes_of_electronics wikiPageWikiLink Amorphous.
• Failure_modes_of_electronics wikiPageWikiLink Amorphous_solid.
• Failure_modes_of_electronics wikiPageWikiLink Antistatic_agent.
• Failure_modes_of_electronics wikiPageWikiLink Arc_welding.
• Failure_modes_of_electronics wikiPageWikiLink Atacamite.
• Failure_modes_of_electronics wikiPageWikiLink Barrier_metal.
• Failure_modes_of_electronics wikiPageWikiLink Bathtub_curve.
• Failure_modes_of_electronics wikiPageWikiLink Biasing.
• Failure_modes_of_electronics wikiPageWikiLink Breakdown_voltage.
• Failure_modes_of_electronics wikiPageWikiLink Burn-in.
• Failure_modes_of_electronics wikiPageWikiLink CCD_camera.
• Failure_modes_of_electronics wikiPageWikiLink Cable.
• Failure_modes_of_electronics wikiPageWikiLink Capacitance.
• Failure_modes_of_electronics wikiPageWikiLink Capacitor_plague.
• Failure_modes_of_electronics wikiPageWikiLink Category:Failure.
• Failure_modes_of_electronics wikiPageWikiLink Category:Fans.
• Failure_modes_of_electronics wikiPageWikiLink Category:Semiconductor_device_defects.
• Failure_modes_of_electronics wikiPageWikiLink Charge-coupled_device.
• Failure_modes_of_electronics wikiPageWikiLink Charge_carrier.
• Failure_modes_of_electronics wikiPageWikiLink Chloride.
• Failure_modes_of_electronics wikiPageWikiLink Chlorinated_hydrocarbon.
• Failure_modes_of_electronics wikiPageWikiLink Circuit_board.
• Failure_modes_of_electronics wikiPageWikiLink Contactor.
• Failure_modes_of_electronics wikiPageWikiLink Copper.
• Failure_modes_of_electronics wikiPageWikiLink Copper(II)_oxide.
• Failure_modes_of_electronics wikiPageWikiLink Corrosion.
• Failure_modes_of_electronics wikiPageWikiLink Cosmic_ray.
• Failure_modes_of_electronics wikiPageWikiLink Current-voltage_characteristic.
• Failure_modes_of_electronics wikiPageWikiLink Current_crowding.
• Failure_modes_of_electronics wikiPageWikiLink Current_filament.
• Failure_modes_of_electronics wikiPageWikiLink Current–voltage_characteristic.
• Failure_modes_of_electronics wikiPageWikiLink Damped_wave.
• Failure_modes_of_electronics wikiPageWikiLink Dielectric_breakdown.
• Failure_modes_of_electronics wikiPageWikiLink Dielectric_loss.
• Failure_modes_of_electronics wikiPageWikiLink Diffusion_barrier.
• Failure_modes_of_electronics wikiPageWikiLink Dislocation.
• Failure_modes_of_electronics wikiPageWikiLink Dissipation_factor.
• Failure_modes_of_electronics wikiPageWikiLink EEPROM.
• Failure_modes_of_electronics wikiPageWikiLink Elasticity_(physics).
• Failure_modes_of_electronics wikiPageWikiLink Electric_arc.
• Failure_modes_of_electronics wikiPageWikiLink Electrical_breakdown.
• Failure_modes_of_electronics wikiPageWikiLink Electrical_transient.
• Failure_modes_of_electronics wikiPageWikiLink Electrolytic_capacitor.
• Failure_modes_of_electronics wikiPageWikiLink Electromigration.
• Failure_modes_of_electronics wikiPageWikiLink Electronic_packaging.
• Failure_modes_of_electronics wikiPageWikiLink Failure_causes.
• Failure_modes_of_electronics wikiPageWikiLink Failure_mode.
• Failure_modes_of_electronics wikiPageWikiLink Failure_rate.
• Failure_modes_of_electronics wikiPageWikiLink Fatigue_(material).
• Failure_modes_of_electronics wikiPageWikiLink Flame_retardant.
• Failure_modes_of_electronics wikiPageWikiLink Floating-gate_MOSFET.
• Failure_modes_of_electronics wikiPageWikiLink Floating_gate.
• Failure_modes_of_electronics wikiPageWikiLink Flux_(metallurgy).
• Failure_modes_of_electronics wikiPageWikiLink Fracture.
• Failure_modes_of_electronics wikiPageWikiLink Gallium_arsenide.
• Failure_modes_of_electronics wikiPageWikiLink Gallium_arsenide_phosphide.
• Failure_modes_of_electronics wikiPageWikiLink Gallium_nitride.
• Failure_modes_of_electronics wikiPageWikiLink Gate_oxide.
• Failure_modes_of_electronics wikiPageWikiLink Glass_transition.
• Failure_modes_of_electronics wikiPageWikiLink Glass_transition_temperature.
• Failure_modes_of_electronics wikiPageWikiLink Ground_bounce.
• Failure_modes_of_electronics wikiPageWikiLink Halogen.
• Failure_modes_of_electronics wikiPageWikiLink Helium.
• Failure_modes_of_electronics wikiPageWikiLink Hot-carrier_injection.
• Failure_modes_of_electronics wikiPageWikiLink Hot_carrier_injection.
• Failure_modes_of_electronics wikiPageWikiLink Hot_electron.
• Failure_modes_of_electronics wikiPageWikiLink Hydride.
• Failure_modes_of_electronics wikiPageWikiLink Hydrogen.
• Failure_modes_of_electronics wikiPageWikiLink Hydrolysis.
• Failure_modes_of_electronics wikiPageWikiLink Hygroscopy.
• Failure_modes_of_electronics wikiPageWikiLink Indium_gallium_nitride.
• Failure_modes_of_electronics wikiPageWikiLink Indium_phosphide.
• Failure_modes_of_electronics wikiPageWikiLink Indium_tin_oxide.
• Failure_modes_of_electronics wikiPageWikiLink Inductance.
• Failure_modes_of_electronics wikiPageWikiLink Infrared.
• Failure_modes_of_electronics wikiPageWikiLink Intermetallic.
• Failure_modes_of_electronics wikiPageWikiLink Ionizing_radiation.
• Failure_modes_of_electronics wikiPageWikiLink JEDEC78.
• Failure_modes_of_electronics wikiPageWikiLink Joule_heat.
• Failure_modes_of_electronics wikiPageWikiLink Joule_heating.
• Failure_modes_of_electronics wikiPageWikiLink Kirkendall_effect.
• Failure_modes_of_electronics wikiPageWikiLink Kirkendall_voiding.
• Failure_modes_of_electronics wikiPageWikiLink Latch-up.
• Failure_modes_of_electronics wikiPageWikiLink Latchup.
• Failure_modes_of_electronics wikiPageWikiLink Lead_frame.
• Failure_modes_of_electronics wikiPageWikiLink Leakage_(electronics).
• Failure_modes_of_electronics wikiPageWikiLink Leakage_current.
• Failure_modes_of_electronics wikiPageWikiLink MESFET.
• Failure_modes_of_electronics wikiPageWikiLink MOSFET.

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