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- Electron_beam-induced_current abstract "Electron-beam-induced current (EBIC) is a semiconductor analysis technique performed in a scanning electron microscope (SEM) or scanning transmission electron microscope (STEM). It is used to identify buried junctions or defects in semiconductors, or to examine minority carrier properties. EBIC is similar to cathodoluminescence in that it depends on the creation of electron–hole pairs in the semiconductor sample by the microscope's electron beam. This technique is used in semiconductor failure analysis and solid-state physics.".
- Electron_beam-induced_current thumbnail Ebic_figure.jpg?width=300.
- Electron_beam-induced_current wikiPageExternalLink nl502995q.
- Electron_beam-induced_current wikiPageExternalLink nl502995q).
- Electron_beam-induced_current wikiPageExternalLink www.ephemeron-labs.com.
- Electron_beam-induced_current wikiPageID "6905518".
- Electron_beam-induced_current wikiPageLength "6241".
- Electron_beam-induced_current wikiPageOutDegree "30".
- Electron_beam-induced_current wikiPageRevisionID "646406327".
- Electron_beam-induced_current wikiPageWikiLink Ammeter.
- Electron_beam-induced_current wikiPageWikiLink CMOS.
- Electron_beam-induced_current wikiPageWikiLink Carrier_generation_and_recombination.
- Electron_beam-induced_current wikiPageWikiLink Category:Electron_beam.
- Electron_beam-induced_current wikiPageWikiLink Category:Scientific_techniques.
- Electron_beam-induced_current wikiPageWikiLink Category:Semiconductor_analysis.
- Electron_beam-induced_current wikiPageWikiLink Category:Semiconductor_device_fabrication.
- Electron_beam-induced_current wikiPageWikiLink Cathodoluminescence.
- Electron_beam-induced_current wikiPageWikiLink Charge_carrier.
- Electron_beam-induced_current wikiPageWikiLink Depletion_region.
- Electron_beam-induced_current wikiPageWikiLink Electric_field.
- Electron_beam-induced_current wikiPageWikiLink Electron–hole_pair.
- Electron_beam-induced_current wikiPageWikiLink Failure_analysis.
- Electron_beam-induced_current wikiPageWikiLink File:Ebic_figure.jpg.
- Electron_beam-induced_current wikiPageWikiLink File:Ebic_image_4.jpg.
- Electron_beam-induced_current wikiPageWikiLink High-k_dielectric.
- Electron_beam-induced_current wikiPageWikiLink High-κ_dielectric.
- Electron_beam-induced_current wikiPageWikiLink Lau_Wai_Shing.
- Electron_beam-induced_current wikiPageWikiLink MOSFET.
- Electron_beam-induced_current wikiPageWikiLink Metal_Oxide_Semiconductor.
- Electron_beam-induced_current wikiPageWikiLink Minority_carrier.
- Electron_beam-induced_current wikiPageWikiLink P-n_junction.
- Electron_beam-induced_current wikiPageWikiLink P–n_junction.
- Electron_beam-induced_current wikiPageWikiLink Scanning_electron_microscope.
- Electron_beam-induced_current wikiPageWikiLink Scanning_transmission_electron_microscope.
- Electron_beam-induced_current wikiPageWikiLink Scanning_transmission_electron_microscopy.
- Electron_beam-induced_current wikiPageWikiLink Schottky_diode.
- Electron_beam-induced_current wikiPageWikiLink Semiconductor.
- Electron_beam-induced_current wikiPageWikiLink Silicon.
- Electron_beam-induced_current wikiPageWikiLink Solar_cell.
- Electron_beam-induced_current wikiPageWikiLink Solid-state_physics.
- Electron_beam-induced_current wikiPageWikiLink File:Ebic_image_2.jpg.
- Electron_beam-induced_current wikiPageWikiLink File:Ebic_image_3.jpg.
- Electron_beam-induced_current wikiPageWikiLinkText "Electron beam-induced current".
- Electron_beam-induced_current hasPhotoCollection Electron_beam-induced_current.
- Electron_beam-induced_current wikiPageUsesTemplate Template:Cite_conference.
- Electron_beam-induced_current subject Category:Electron_beam.
- Electron_beam-induced_current subject Category:Scientific_techniques.
- Electron_beam-induced_current subject Category:Semiconductor_analysis.
- Electron_beam-induced_current subject Category:Semiconductor_device_fabrication.
- Electron_beam-induced_current hypernym Technique.
- Electron_beam-induced_current type Software.
- Electron_beam-induced_current type Process.
- Electron_beam-induced_current type Semiconductor.
- Electron_beam-induced_current type Technique.
- Electron_beam-induced_current comment "Electron-beam-induced current (EBIC) is a semiconductor analysis technique performed in a scanning electron microscope (SEM) or scanning transmission electron microscope (STEM). It is used to identify buried junctions or defects in semiconductors, or to examine minority carrier properties. EBIC is similar to cathodoluminescence in that it depends on the creation of electron–hole pairs in the semiconductor sample by the microscope's electron beam.".
- Electron_beam-induced_current label "Electron beam-induced current".
- Electron_beam-induced_current sameAs EBIC.
- Electron_beam-induced_current sameAs m.0gwfv8.
- Electron_beam-induced_current sameAs Q3717138.
- Electron_beam-induced_current sameAs Q3717138.
- Electron_beam-induced_current wasDerivedFrom Electron_beam-induced_current?oldid=646406327.
- Electron_beam-induced_current depiction Ebic_figure.jpg.
- Electron_beam-induced_current isPrimaryTopicOf Electron_beam-induced_current.