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- Conductive_atomic_force_microscopy abstract "Conductive atomic force microscopy (C-AFM) is a variation of atomic force microscopy (AFM) and scanning tunneling microscopy (STM), which uses electrical current to construct the surface profile of the studied sample. The current is flowing through the metal-coated tip of the microscope and the conducting sample. Usual AFM topography, obtained by vibrating the tip, is acquired simultaneously with the current. This enables to correlate a spatial feature on the sample with its conductivity, and distinguishes C-AFM from STM where only current is recorded. A C-AFM microscope uses conventional silicon tips coated with a metal or metallic alloy, such as Pt-Ir alloy.The C-AFM can be operated in the imaging mode and spectroscopic mode.".
- Conductive_atomic_force_microscopy wikiPageID "24580913".
- Conductive_atomic_force_microscopy wikiPageLength "3509".
- Conductive_atomic_force_microscopy wikiPageOutDegree "11".
- Conductive_atomic_force_microscopy wikiPageRevisionID "646713571".
- Conductive_atomic_force_microscopy wikiPageWikiLink Atomic_force_microscopy.
- Conductive_atomic_force_microscopy wikiPageWikiLink Category:Microscopy.
- Conductive_atomic_force_microscopy wikiPageWikiLink Category:Scanning_probe_microscopy.
- Conductive_atomic_force_microscopy wikiPageWikiLink Current–voltage_characteristic.
- Conductive_atomic_force_microscopy wikiPageWikiLink Density_of_states.
- Conductive_atomic_force_microscopy wikiPageWikiLink Electric_current.
- Conductive_atomic_force_microscopy wikiPageWikiLink Electrical_current.
- Conductive_atomic_force_microscopy wikiPageWikiLink Microscopy.
- Conductive_atomic_force_microscopy wikiPageWikiLink Scanning_probe_microscopy.
- Conductive_atomic_force_microscopy wikiPageWikiLink Scanning_tunneling_microscope.
- Conductive_atomic_force_microscopy wikiPageWikiLink Scanning_tunneling_microscopy.
- Conductive_atomic_force_microscopy wikiPageWikiLink Scanning_tunneling_spectroscopy.
- Conductive_atomic_force_microscopy wikiPageWikiLink Spin_polarized_scanning_tunneling_microscopy.
- Conductive_atomic_force_microscopy wikiPageWikiLinkText "conductive atomic force microscopy".
- Conductive_atomic_force_microscopy hasPhotoCollection Conductive_atomic_force_microscopy.
- Conductive_atomic_force_microscopy wikiPageUsesTemplate Template:Commons_category.
- Conductive_atomic_force_microscopy wikiPageUsesTemplate Template:One_source.
- Conductive_atomic_force_microscopy wikiPageUsesTemplate Template:Reflist.
- Conductive_atomic_force_microscopy wikiPageUsesTemplate Template:SPM2.
- Conductive_atomic_force_microscopy wikiPageUsesTemplate Template:Wikibooks.
- Conductive_atomic_force_microscopy subject Category:Microscopy.
- Conductive_atomic_force_microscopy subject Category:Scanning_probe_microscopy.
- Conductive_atomic_force_microscopy hypernym Variation.
- Conductive_atomic_force_microscopy type Food.
- Conductive_atomic_force_microscopy type Instrument.
- Conductive_atomic_force_microscopy type Instrument.
- Conductive_atomic_force_microscopy comment "Conductive atomic force microscopy (C-AFM) is a variation of atomic force microscopy (AFM) and scanning tunneling microscopy (STM), which uses electrical current to construct the surface profile of the studied sample. The current is flowing through the metal-coated tip of the microscope and the conducting sample. Usual AFM topography, obtained by vibrating the tip, is acquired simultaneously with the current.".
- Conductive_atomic_force_microscopy label "Conductive atomic force microscopy".
- Conductive_atomic_force_microscopy sameAs m.080754n.
- Conductive_atomic_force_microscopy sameAs Q5159384.
- Conductive_atomic_force_microscopy sameAs Q5159384.
- Conductive_atomic_force_microscopy wasDerivedFrom Conductive_atomic_force_microscopy?oldid=646713571.
- Conductive_atomic_force_microscopy isPrimaryTopicOf Conductive_atomic_force_microscopy.