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- specifying-and-evaluating-thin-film-metrology-tools.html accessdate "2011-10-05".
- specifying-and-evaluating-thin-film-metrology-tools.html date "June 1999".
- specifying-and-evaluating-thin-film-metrology-tools.html first "Moshe".
- specifying-and-evaluating-thin-film-metrology-tools.html isCitedBy Nova_Measuring_Instruments.
- specifying-and-evaluating-thin-film-metrology-tools.html issue "6".
- specifying-and-evaluating-thin-film-metrology-tools.html journal "Solid State Technology".
- specifying-and-evaluating-thin-film-metrology-tools.html last "Finarov".
- specifying-and-evaluating-thin-film-metrology-tools.html page "111".
- specifying-and-evaluating-thin-film-metrology-tools.html quote "Moshe Finarov received his PhD in semiconductor physics from the Technical University in Moscow.".
- specifying-and-evaluating-thin-film-metrology-tools.html title "Specifying and evaluating thin-film metrology tools".
- specifying-and-evaluating-thin-film-metrology-tools.html url "http://www.electroiq.com/articles/sst/print/volume-42/issue-6/features/metrology-test/specifying-and-evaluating-thin-film-metrology-tools.html".
- specifying-and-evaluating-thin-film-metrology-tools.html volume "42".