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- Q3717138 subject Q6425689.
- Q3717138 subject Q6991015.
- Q3717138 subject Q8728761.
- Q3717138 subject Q8728768.
- Q3717138 abstract "Electron-beam-induced current (EBIC) is a semiconductor analysis technique performed in a scanning electron microscope (SEM) or scanning transmission electron microscope (STEM). It is used to identify buried junctions or defects in semiconductors, or to examine minority carrier properties. EBIC is similar to cathodoluminescence in that it depends on the creation of electron–hole pairs in the semiconductor sample by the microscope's electron beam. This technique is used in semiconductor failure analysis and solid-state physics.".
- Q3717138 thumbnail Ebic_figure.jpg?width=300.
- Q3717138 wikiPageExternalLink nl502995q.
- Q3717138 wikiPageExternalLink nl502995q).
- Q3717138 wikiPageExternalLink www.ephemeron-labs.com.
- Q3717138 wikiPageWikiLink Q1022240.
- Q3717138 wikiPageWikiLink Q11456.
- Q3717138 wikiPageWikiLink Q132013.
- Q3717138 wikiPageWikiLink Q166046.
- Q3717138 wikiPageWikiLink Q173431.
- Q3717138 wikiPageWikiLink Q176066.
- Q3717138 wikiPageWikiLink Q176300.
- Q3717138 wikiPageWikiLink Q210793.
- Q3717138 wikiPageWikiLink Q288224.
- Q3717138 wikiPageWikiLink Q321095.
- Q3717138 wikiPageWikiLink Q351558.
- Q3717138 wikiPageWikiLink Q369794.
- Q3717138 wikiPageWikiLink Q46221.
- Q3717138 wikiPageWikiLink Q58803.
- Q3717138 wikiPageWikiLink Q6425689.
- Q3717138 wikiPageWikiLink Q6497654.
- Q3717138 wikiPageWikiLink Q670.
- Q3717138 wikiPageWikiLink Q6991015.
- Q3717138 wikiPageWikiLink Q715396.
- Q3717138 wikiPageWikiLink Q865807.
- Q3717138 wikiPageWikiLink Q8728761.
- Q3717138 wikiPageWikiLink Q8728768.
- Q3717138 wikiPageWikiLink Q874835.
- Q3717138 comment "Electron-beam-induced current (EBIC) is a semiconductor analysis technique performed in a scanning electron microscope (SEM) or scanning transmission electron microscope (STEM). It is used to identify buried junctions or defects in semiconductors, or to examine minority carrier properties. EBIC is similar to cathodoluminescence in that it depends on the creation of electron–hole pairs in the semiconductor sample by the microscope's electron beam.".
- Q3717138 label "Electron beam-induced current".
- Q3717138 depiction Ebic_figure.jpg.