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- Q18206764 subject Q8821916.
- Q18206764 abstract "The electron-refractive effect or Electron Induced Permittivity Modification (EIPM) is an electro-optic effect observed in some crystals and amorphous materials, such as chalcogenide glasses and oxides, where the permittivity reduces or increases when the material is illuminated by high energy electrons, typically from an transmission electron microscope or scanning electron microscope. The effect is non-linear and reversible.The effect was observed by N. Normand and O. Normand., who observed that the permittivity, of chalcogenide glass increased by as much as 5% when irradiated with an electron gun in the 30keV range; they also noticed that the change was accompanied by a change in the thickness of the film. Recently San-Roman-Alerigi, Anjum and Ooi, demonstrated that the permittivity of chalcogenide thin films could also be reduced by as much as 50% when the sample was illuminated by 300keV electrons; moreover they also demonstrated that the electron induced permittivity modification was reversible".
- Q18206764 wikiPageWikiLink Q211569.
- Q18206764 wikiPageWikiLink Q321095.
- Q18206764 wikiPageWikiLink Q505293.
- Q18206764 wikiPageWikiLink Q5068626.
- Q18206764 wikiPageWikiLink Q50690.
- Q18206764 wikiPageWikiLink Q677139.
- Q18206764 wikiPageWikiLink Q744818.
- Q18206764 wikiPageWikiLink Q8821916.
- Q18206764 comment "The electron-refractive effect or Electron Induced Permittivity Modification (EIPM) is an electro-optic effect observed in some crystals and amorphous materials, such as chalcogenide glasses and oxides, where the permittivity reduces or increases when the material is illuminated by high energy electrons, typically from an transmission electron microscope or scanning electron microscope. The effect is non-linear and reversible.The effect was observed by N. Normand and O.".
- Q18206764 label "Electron-refractive effect".