Matches in DBpedia 2016-04 for { <http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=1300833> ?p ?o }
Showing triples 1 to 15 of
15
with 100 triples per page.
- freeabs_all.jsp?arnumber=1300833 accessdate "2013-06-07".
- freeabs_all.jsp?arnumber=1300833 first1 "C.C.".
- freeabs_all.jsp?arnumber=1300833 first2 "L. R. C.".
- freeabs_all.jsp?arnumber=1300833 first3 "A. year=2004".
- freeabs_all.jsp?arnumber=1300833 isCitedBy Polysilicon_depletion_effect.
- freeabs_all.jsp?arnumber=1300833 issue "6".
- freeabs_all.jsp?arnumber=1300833 journal "Electron Devices, IEEE Transactions on".
- freeabs_all.jsp?arnumber=1300833 last1 "Hobbs".
- freeabs_all.jsp?arnumber=1300833 last2 "Fonseca".
- freeabs_all.jsp?arnumber=1300833 last3 "Knizhnik".
- freeabs_all.jsp?arnumber=1300833 pages "971–977".
- freeabs_all.jsp?arnumber=1300833 publisher "IEEE".
- freeabs_all.jsp?arnumber=1300833 title "Fermi-level pinning at the polysilicon/metal oxide interface-Part I".
- freeabs_all.jsp?arnumber=1300833 url freeabs_all.jsp?arnumber=1300833.
- freeabs_all.jsp?arnumber=1300833 volume "51".