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- rd.401.0041 accessdate "2013-03-04".
- rd.401.0041 date "January 1996".
- rd.401.0041 doi "10.1147/rd.401.0041".
- rd.401.0041 first1 "T. J.".
- rd.401.0041 first2 "J. M.".
- rd.401.0041 first3 "A. H.".
- rd.401.0041 first4 "J. F.".
- rd.401.0041 first5 "H. P.".
- rd.401.0041 first6 "C. J.".
- rd.401.0041 first7 "H. W.".
- rd.401.0041 first8 "J. L.".
- rd.401.0041 isCitedBy Data_degradation.
- rd.401.0041 issue "1".
- rd.401.0041 journal "IBM Journal of Research and Development".
- rd.401.0041 last1 "O'Gorman".
- rd.401.0041 last2 "Ross".
- rd.401.0041 last3 "Taber".
- rd.401.0041 last4 "Ziegler".
- rd.401.0041 last5 "Muhlfeld".
- rd.401.0041 last6 "Montrose".
- rd.401.0041 last7 "Curtis".
- rd.401.0041 last8 "Walsh".
- rd.401.0041 pages "41–50".
- rd.401.0041 title "Field testing for cosmic ray soft errors in semiconductor memories".
- rd.401.0041 url login.jsp?tp=&arnumber=5389436&url=http%3A%2F%2Fieeexplore.ieee.org%2Fstamp%2Fstamp.jsp%3Ftp%3D%26arnumber%3D5389436.
- rd.401.0041 volume "40".