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- tr.1980.5220742 date "1980-06-01".
- tr.1980.5220742 doi "10.1109/TR.1980.5220742".
- tr.1980.5220742 first "Wayne".
- tr.1980.5220742 first1 "W.".
- tr.1980.5220742 isCitedBy Accelerated_life_testing.
- tr.1980.5220742 issn "0018-9529".
- tr.1980.5220742 issue "2".
- tr.1980.5220742 journal "IEEE Transactions on Reliability".
- tr.1980.5220742 last "Nelson".
- tr.1980.5220742 last1 "Nelson".
- tr.1980.5220742 page "103".
- tr.1980.5220742 pages "103–108".
- tr.1980.5220742 title "Accelerated Life Testing - Step-Stress Models and Data Analyses".
- tr.1980.5220742 url "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5220742".
- tr.1980.5220742 volume "R-29".
- tr.1980.5220742 year "1980".