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- iedm.2002.1175937 author "Jing Guo".
- iedm.2002.1175937 author7Link "Hongjie Dai".
- iedm.2002.1175937 chapter "Assessment of silicon MOS and carbon nanotube FET performance limits using a general theory of ballistic transistors".
- iedm.2002.1175937 date "2002".
- iedm.2002.1175937 doi "10.1109/IEDM.2002.1175937".
- iedm.2002.1175937 first2 "S.".
- iedm.2002.1175937 first3 "M.".
- iedm.2002.1175937 first4 "M.".
- iedm.2002.1175937 first5 "P.".
- iedm.2002.1175937 first6 "A.".
- iedm.2002.1175937 first9 "P.".
- iedm.2002.1175937 isCitedBy Carbon_nanotube_field-effect_transistor.
- iedm.2002.1175937 isbn "0-7803-7462-2".
- iedm.2002.1175937 last2 "Datta".
- iedm.2002.1175937 last3 "Lundstrom".
- iedm.2002.1175937 last4 "Brink".
- iedm.2002.1175937 last5 "McEuen".
- iedm.2002.1175937 last6 "Javey".
- iedm.2002.1175937 last7 "Hongjie Dai".
- iedm.2002.1175937 last8 "Hyoungsub Kim".
- iedm.2002.1175937 last9 "McIntyre".
- iedm.2002.1175937 page "711".
- iedm.2002.1175937 title "Digest. International Electron Devices Meeting".
- iedm.2002.1175937 url "http://www.guo.ece.ufl.edu/iedm02_final.pdf".