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- 1.117801 accessdate "2009-10-05".
- 1.117801 author2 "R. G. Beck, M. Topinka, J. A. Katine, R. M. Westervelt, K. L. Campman, A. C. Gossard".
- 1.117801 bibcode "1996ApPhL..69..671E".
- 1.117801 date "1996-07-29".
- 1.117801 doi "10.1063/1.117801".
- 1.117801 first "M. A.".
- 1.117801 isCitedBy Scanning_probe_microscopy.
- 1.117801 issue "5".
- 1.117801 journal "Applied Physics Letters".
- 1.117801 last "Eriksson".
- 1.117801 pages "671–673".
- 1.117801 title "Cryogenic scanning probe characterization of semiconductor nanostructures".
- 1.117801 url 1.
- 1.117801 volume "69".