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- j.microrel.2011.06.061 displayAuthors "8".
- j.microrel.2011.06.061 doi "10.1016/j.microrel.2011.06.061".
- j.microrel.2011.06.061 first1 "Jiann Min".
- j.microrel.2011.06.061 first10 "Syahirah".
- j.microrel.2011.06.061 first11 "Mei Chyn".
- j.microrel.2011.06.061 first12 "Ming Chuan".
- j.microrel.2011.06.061 first2 "Vinod".
- j.microrel.2011.06.061 first3 "Xiaole".
- j.microrel.2011.06.061 first4 "Meng Yeow".
- j.microrel.2011.06.061 first5 "Angeline".
- j.microrel.2011.06.061 first6 "Venkat".
- j.microrel.2011.06.061 first7 "Lwin Hnin".
- j.microrel.2011.06.061 first8 "Soon Huat".
- j.microrel.2011.06.061 first9 "Chea Wei".
- j.microrel.2011.06.061 isCitedBy TeraView.
- j.microrel.2011.06.061 issue "9–11".
- j.microrel.2011.06.061 journal "Microelectronics Reliability".
- j.microrel.2011.06.061 last1 "Chin".
- j.microrel.2011.06.061 last10 "Zulkifli".
- j.microrel.2011.06.061 last11 "Ong".
- j.microrel.2011.06.061 last12 "Tan".
- j.microrel.2011.06.061 last2 "Narang".
- j.microrel.2011.06.061 last3 "Zhao".
- j.microrel.2011.06.061 last4 "Tay".
- j.microrel.2011.06.061 last5 "Phoa".
- j.microrel.2011.06.061 last6 "Ravikumar".
- j.microrel.2011.06.061 last7 "Ei".
- j.microrel.2011.06.061 last8 "Lim".
- j.microrel.2011.06.061 last9 "Teo".
- j.microrel.2011.06.061 pages "1440–8".
- j.microrel.2011.06.061 title "Fault isolation in semiconductor product, process, physical and package failure analysis: Importance and overview".
- j.microrel.2011.06.061 volume "51".
- j.microrel.2011.06.061 year "2011".