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- j.elecom.2010.05.014 doi "10.1016/j.elecom.2010.05.014".
- j.elecom.2010.05.014 first1 "P.R.".
- j.elecom.2010.05.014 first2 "J.".
- j.elecom.2010.05.014 first3 "J.".
- j.elecom.2010.05.014 first4 "W.K.".
- j.elecom.2010.05.014 first5 "M.".
- j.elecom.2010.05.014 first6 "N.P.".
- j.elecom.2010.05.014 isCitedBy Amira_(software).
- j.elecom.2010.05.014 journal "Electrochemistry Communications".
- j.elecom.2010.05.014 last1 "Shearing".
- j.elecom.2010.05.014 last2 "Gelb".
- j.elecom.2010.05.014 last3 "Yi".
- j.elecom.2010.05.014 last4 "Lee".
- j.elecom.2010.05.014 last5 "Drakopolous".
- j.elecom.2010.05.014 last6 "Brandon".
- j.elecom.2010.05.014 pages "1021–1024".
- j.elecom.2010.05.014 publisher "Elsevier".
- j.elecom.2010.05.014 title "Analysis of Triple Phase Contact in Ni-YSZ Microstructures Using Non-destructive X-ray Tomography with Synchrotron Radiation".
- j.elecom.2010.05.014 url S1388248110002080.
- j.elecom.2010.05.014 volume "12".
- j.elecom.2010.05.014 year "2010".