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- Single_event_upset abstract "A single event upset (SEU) is a change of state caused by one single ionizing particle (ions, electrons, photons...) striking a sensitive node in a micro-electronic device, such as in a microprocessor, semiconductor memory, or power transistors. The state change is a result of the free charge created by ionization in or close to an important node of a logic element (e.g. memory \"bit\"). The error in device output or operation caused as a result of the strike is called an SEU or a soft error.The SEU itself is not considered permanently damaging to the transistor's or circuits' functionality unlike the case of single event latchup (SEL), single event gate rupture (SEGR), or single event burnout (SEB). These are all examples of a general class of radiation effects in electronic devices called single event effects.".
- Single_event_upset wikiPageExternalLink nph-abs_connect.
- Single_event_upset wikiPageExternalLink CRC-TR-01-4.pdf.
- Single_event_upset wikiPageExternalLink Target_Arch_Report.html.
- Single_event_upset wikiPageExternalLink pqdweb?did=1203585601&sid=1&Fmt=2&clientId=7483&RQT=309&VName=PQD.
- Single_event_upset wikiPageExternalLink see.htm.
- Single_event_upset wikiPageExternalLink 521.
- Single_event_upset wikiPageExternalLink Fault_analysis.pdf.
- Single_event_upset wikiPageExternalLink stx-seu.html.
- Single_event_upset wikiPageExternalLink publications.
- Single_event_upset wikiPageExternalLink see.
- Single_event_upset wikiPageExternalLink kobayashi.pdf.
- Single_event_upset wikiPageExternalLink rd40-1.html.
- Single_event_upset wikiPageExternalLink www.seutest.com.
- Single_event_upset wikiPageExternalLink li.html.
- Single_event_upset wikiPageID "2158886".
- Single_event_upset wikiPageLength "10140".
- Single_event_upset wikiPageOutDegree "43".
- Single_event_upset wikiPageRevisionID "707966574".
- Single_event_upset wikiPageWikiLink Alpha_particle.
- Single_event_upset wikiPageWikiLink Caesium-137.
- Single_event_upset wikiPageWikiLink Category:Digital_electronics.
- Single_event_upset wikiPageWikiLink Cosmic_ray.
- Single_event_upset wikiPageWikiLink Cyclotron.
- Single_event_upset wikiPageWikiLink ECC_memory.
- Single_event_upset wikiPageWikiLink Elementary_particle.
- Single_event_upset wikiPageWikiLink Epitaxy.
- Single_event_upset wikiPageWikiLink Gate_rupture.
- Single_event_upset wikiPageWikiLink Goddard_Space_Flight_Center.
- Single_event_upset wikiPageWikiLink Gray_code.
- Single_event_upset wikiPageWikiLink Hamming_distance.
- Single_event_upset wikiPageWikiLink IBM.
- Single_event_upset wikiPageWikiLink Integrated_circuit_packaging.
- Single_event_upset wikiPageWikiLink Ionization.
- Single_event_upset wikiPageWikiLink Latch-up.
- Single_event_upset wikiPageWikiLink Microprocessor.
- Single_event_upset wikiPageWikiLink Nuclear_weapons_testing.
- Single_event_upset wikiPageWikiLink Parasitic_structure.
- Single_event_upset wikiPageWikiLink Parity_bit.
- Single_event_upset wikiPageWikiLink Particle_accelerator.
- Single_event_upset wikiPageWikiLink Radiation_hardening.
- Single_event_upset wikiPageWikiLink Radioactive_decay.
- Single_event_upset wikiPageWikiLink Ring_counter.
- Single_event_upset wikiPageWikiLink Semiconductor.
- Single_event_upset wikiPageWikiLink Semiconductor_memory.
- Single_event_upset wikiPageWikiLink Silicon_on_insulator.
- Single_event_upset wikiPageWikiLink Silicon_on_sapphire.
- Single_event_upset wikiPageWikiLink Single-event_transients.
- Single_event_upset wikiPageWikiLink Soft_error.
- Single_event_upset wikiPageWikiLink Thermal_runaway.
- Single_event_upset wikiPageWikiLink Thyristor.
- Single_event_upset wikiPageWikiLink Timothy_C._May.
- Single_event_upset wikiPageWikiLink Transistor.
- Single_event_upset wikiPageWikiLink Van_Allen_radiation_belt.
- Single_event_upset wikiPageWikiLink Yale_University.
- Single_event_upset wikiPageWikiLinkText "SEU".
- Single_event_upset wikiPageWikiLinkText "Single event upset".
- Single_event_upset wikiPageWikiLinkText "Single-event latchup".
- Single_event_upset wikiPageWikiLinkText "errors caused by radiation".
- Single_event_upset wikiPageWikiLinkText "single bit upsets".
- Single_event_upset wikiPageWikiLinkText "single event effects".
- Single_event_upset wikiPageWikiLinkText "single event upset (SEU)".
- Single_event_upset wikiPageWikiLinkText "single event upset".
- Single_event_upset wikiPageWikiLinkText "single-bit upsets".
- Single_event_upset wikiPageWikiLinkText "upset events".
- Single_event_upset wikiPageUsesTemplate Template:Cite_book.
- Single_event_upset wikiPageUsesTemplate Template:Ill.
- Single_event_upset wikiPageUsesTemplate Template:More_footnotes.
- Single_event_upset subject Category:Digital_electronics.
- Single_event_upset hypernym Change.
- Single_event_upset type Organisation.
- Single_event_upset comment "A single event upset (SEU) is a change of state caused by one single ionizing particle (ions, electrons, photons...) striking a sensitive node in a micro-electronic device, such as in a microprocessor, semiconductor memory, or power transistors. The state change is a result of the free charge created by ionization in or close to an important node of a logic element (e.g. memory \"bit\").".
- Single_event_upset label "Single event upset".
- Single_event_upset sameAs Q1476733.
- Single_event_upset sameAs Single_Event_Upset.
- Single_event_upset sameAs m.06r59m.
- Single_event_upset sameAs Single_event_upset.
- Single_event_upset sameAs Single_event_upset.
- Single_event_upset sameAs Q1476733.
- Single_event_upset sameAs 单粒子翻转.
- Single_event_upset wasDerivedFrom Single_event_upset?oldid=707966574.
- Single_event_upset isPrimaryTopicOf Single_event_upset.