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- High-temperature_operating_life abstract "High-temperature operating life (HTOL) is a reliability test applied to integrated circuits (ICs) to determine their intrinsic reliability. This test stresses the IC at an elevated temperature, high voltage and dynamic operation for a predefined period of time. The IC is usually monitored under stress and tested at intermediate intervals. This reliability stress test is sometimes referred to as a \"lifetime test\", \"device life test\" or \"extended burn in test\" and is used to trigger potential failure modes and assess IC lifetime.There are several types of HTOL: AEC Documents. JEDEC Standards. Mil standards.↑ ↑ ↑".
- High-temperature_operating_life thumbnail Static_.jpg?width=300.
- High-temperature_operating_life wikiPageExternalLink index.htm.
- High-temperature_operating_life wikiPageExternalLink 4510atr.pdf.
- High-temperature_operating_life wikiPageExternalLink HTOL.htm.
- High-temperature_operating_life wikiPageExternalLink relbasics43.htm.
- High-temperature_operating_life wikiPageID "37562074".
- High-temperature_operating_life wikiPageLength "16984".
- High-temperature_operating_life wikiPageOutDegree "37".
- High-temperature_operating_life wikiPageRevisionID "656323291".
- High-temperature_operating_life wikiPageWikiLink Arrhenius_equation.
- High-temperature_operating_life wikiPageWikiLink Boundary_scan.
- High-temperature_operating_life wikiPageWikiLink Built-in_self-test.
- High-temperature_operating_life wikiPageWikiLink Burn-in.
- High-temperature_operating_life wikiPageWikiLink Category:Articles_created_via_the_Article_Wizard.
- High-temperature_operating_life wikiPageWikiLink Category:Reliability_engineering.
- High-temperature_operating_life wikiPageWikiLink Category:Semiconductor_analysis.
- High-temperature_operating_life wikiPageWikiLink Category:Semiconductors.
- High-temperature_operating_life wikiPageWikiLink Charge_pump.
- High-temperature_operating_life wikiPageWikiLink Duty_cycle.
- High-temperature_operating_life wikiPageWikiLink Electromigration.
- High-temperature_operating_life wikiPageWikiLink Engineering_tolerance.
- High-temperature_operating_life wikiPageWikiLink Failure_analysis.
- High-temperature_operating_life wikiPageWikiLink Failure_of_electronic_components.
- High-temperature_operating_life wikiPageWikiLink Hot-carrier_injection.
- High-temperature_operating_life wikiPageWikiLink IC_power-supply_pin.
- High-temperature_operating_life wikiPageWikiLink Integrated_circuit.
- High-temperature_operating_life wikiPageWikiLink Intrinsic_and_extrinsic_properties.
- High-temperature_operating_life wikiPageWikiLink Joint_Test_Action_Group.
- High-temperature_operating_life wikiPageWikiLink Linear_feedback_shift_register.
- High-temperature_operating_life wikiPageWikiLink Logic_built-in_self-test.
- High-temperature_operating_life wikiPageWikiLink Negative-bias_temperature_instability.
- High-temperature_operating_life wikiPageWikiLink Power_management.
- High-temperature_operating_life wikiPageWikiLink Reliability_(semiconductor).
- High-temperature_operating_life wikiPageWikiLink Sampling_(statistics).
- High-temperature_operating_life wikiPageWikiLink Scan_chain.
- High-temperature_operating_life wikiPageWikiLink Service_life.
- High-temperature_operating_life wikiPageWikiLink Stress_migration.
- High-temperature_operating_life wikiPageWikiLink System_on_a_chip.
- High-temperature_operating_life wikiPageWikiLink Thermodynamic_temperature.
- High-temperature_operating_life wikiPageWikiLink Time-dependent_gate_oxide_breakdown.
- High-temperature_operating_life wikiPageWikiLink Trimmer_(electronics).
- High-temperature_operating_life wikiPageWikiLink Voltage_regulator.
- High-temperature_operating_life wikiPageWikiLink File:Dynamic.jpg.
- High-temperature_operating_life wikiPageWikiLink File:Monitored.jpg.
- High-temperature_operating_life wikiPageWikiLink File:Static_.jpg.
- High-temperature_operating_life wikiPageWikiLink File:Tested.jpg.
- High-temperature_operating_life wikiPageWikiLinkText "High-temperature operating life".
- High-temperature_operating_life wikiPageUsesTemplate Template:Reflist.
- High-temperature_operating_life wikiPageUsesTemplate Template:Use_dmy_dates.
- High-temperature_operating_life subject Category:Articles_created_via_the_Article_Wizard.
- High-temperature_operating_life subject Category:Reliability_engineering.
- High-temperature_operating_life subject Category:Semiconductor_analysis.
- High-temperature_operating_life subject Category:Semiconductors.
- High-temperature_operating_life hypernym Test.
- High-temperature_operating_life type Cricketer.
- High-temperature_operating_life type Discipline.
- High-temperature_operating_life type Physic.
- High-temperature_operating_life type Semiconductor.
- High-temperature_operating_life comment "High-temperature operating life (HTOL) is a reliability test applied to integrated circuits (ICs) to determine their intrinsic reliability. This test stresses the IC at an elevated temperature, high voltage and dynamic operation for a predefined period of time. The IC is usually monitored under stress and tested at intermediate intervals.".
- High-temperature_operating_life label "High-temperature operating life".
- High-temperature_operating_life sameAs Q17029762.
- High-temperature_operating_life sameAs m.0rffb92.
- High-temperature_operating_life sameAs Q17029762.
- High-temperature_operating_life wasDerivedFrom High-temperature_operating_life?oldid=656323291.
- High-temperature_operating_life depiction Static_.jpg.
- High-temperature_operating_life isPrimaryTopicOf High-temperature_operating_life.