Matches in DBpedia 2016-04 for { <http://dbpedia.org/resource/Ellipsometry> ?p ?o }
- Ellipsometry abstract "Ellipsometry is an optical technique for investigating the dielectric properties (complex refractive index or dielectric function) of thin films. Ellipsometry can be used to characterize composition, roughness, thickness (depth), crystalline nature, doping concentration, electrical conductivity and other material properties. It is very sensitive to the change in the optical response of incident radiation that interacts with the material being investigated.Typically, the measured signal is the change in polarization as the incident radiation (in a known state) interacts with the material structure of interest (reflected, absorbed, scattered, or transmitted). The polarization change is quantified by the amplitude ratio, Ψ, and the phase difference, Δ (defined below). Because the signal depends on the thickness as well as the materials properties, ellipsometry can be a universal tool for contact free determination of thickness and optical constants of films of all kinds.This technique has found applications in many different fields, from semiconductor physics to microelectronics and biology, from basic research to industrial applications. Ellipsometry is a very sensitive measurement technique and provides unequaled capabilities for thin film metrology. As an optical technique, spectroscopic ellipsometry is non-destructive and contactless. Because the incident radiation can be focused, small sample sizes can be imaged and desired characteristics can be mapped over a larger area (m2).The one weakness of ellipsometry is the need to model the data. Entire courses are taught in the modeling of the raw data. Models can be physically based on energy transitions or simply free parameters used to fit the data.Upon the analysis of the change of polarization of light, ellipsometry can yield information about layers that are thinner than the wavelength of the probing light itself, even down to a single atomic layer. Ellipsometry can probe the complex refractive index or dielectric function tensor, which gives access to fundamental physical parameters like those listed above. It is commonly used to characterize film thickness for single layers or complex multilayer stacks ranging from a few angstroms or tenths of a nanometer to several micrometers with an excellent accuracy.The name \"ellipsometry\" stems from the fact that Elliptical polarization of light is used. The term \"spectroscopic\" relates to the fact that the information gained is a function of the light's wavelength or energy (spectra). The technique has been known at least since 1888 by the work of Paul Drude, (the term \"ellipsometry\" being first used probably in 1945 ) and has many applications today. A spectroscopic ellipsometer can be found in most thin film analytical labs. Ellipsometry is also becoming more interesting to researchers in other disciplines such as biology and medicine. These areas pose new challenges to the technique, such as measurements on unstable liquid surfaces and microscopic imaging.".
- Ellipsometry wikiPageID "1177592".
- Ellipsometry wikiPageLength "24112".
- Ellipsometry wikiPageOutDegree "117".
- Ellipsometry wikiPageRevisionID "706273539".
- Ellipsometry wikiPageWikiLink Absorption_(electromagnetic_radiation).
- Ellipsometry wikiPageWikiLink Amorphous_solid.
- Ellipsometry wikiPageWikiLink Angle_of_incidence_(optics).
- Ellipsometry wikiPageWikiLink Atom.
- Ellipsometry wikiPageWikiLink Band_gap.
- Ellipsometry wikiPageWikiLink Biology.
- Ellipsometry wikiPageWikiLink Brewsters_angle.
- Ellipsometry wikiPageWikiLink Category:Optical_metrology.
- Ellipsometry wikiPageWikiLink Category:Radiometry.
- Ellipsometry wikiPageWikiLink Category:Spectroscopy.
- Ellipsometry wikiPageWikiLink Charge-coupled_device.
- Ellipsometry wikiPageWikiLink Charge_carrier.
- Ellipsometry wikiPageWikiLink Crystallinity.
- Ellipsometry wikiPageWikiLink Cubic_crystal_system.
- Ellipsometry wikiPageWikiLink Depolarizer_(optics).
- Ellipsometry wikiPageWikiLink Dielectric.
- Ellipsometry wikiPageWikiLink Doping_(semiconductor).
- Ellipsometry wikiPageWikiLink Effective_mass_(solid-state_physics).
- Ellipsometry wikiPageWikiLink Electrical_conductor.
- Ellipsometry wikiPageWikiLink Electrical_resistivity_and_conductivity.
- Ellipsometry wikiPageWikiLink Electromagnetic_radiation.
- Ellipsometry wikiPageWikiLink Electron_density.
- Ellipsometry wikiPageWikiLink Electron_mobility.
- Ellipsometry wikiPageWikiLink Elliptical_polarization.
- Ellipsometry wikiPageWikiLink Exciton.
- Ellipsometry wikiPageWikiLink Fresnel_equations.
- Ellipsometry wikiPageWikiLink Helium–neon_laser.
- Ellipsometry wikiPageWikiLink Imaging_ellipsometry.
- Ellipsometry wikiPageWikiLink In_situ.
- Ellipsometry wikiPageWikiLink Index_ellipsoid.
- Ellipsometry wikiPageWikiLink Infrared.
- Ellipsometry wikiPageWikiLink Isotropy.
- Ellipsometry wikiPageWikiLink Jones_calculus.
- Ellipsometry wikiPageWikiLink Kramers–Kronig_relations.
- Ellipsometry wikiPageWikiLink Laser.
- Ellipsometry wikiPageWikiLink Light.
- Ellipsometry wikiPageWikiLink Low-k_dielectric.
- Ellipsometry wikiPageWikiLink Magnetic_field.
- Ellipsometry wikiPageWikiLink Materials_science.
- Ellipsometry wikiPageWikiLink Metrology.
- Ellipsometry wikiPageWikiLink Microelectronics.
- Ellipsometry wikiPageWikiLink Micrometre.
- Ellipsometry wikiPageWikiLink Monochrome.
- Ellipsometry wikiPageWikiLink Mueller_calculus.
- Ellipsometry wikiPageWikiLink Nanometre.
- Ellipsometry wikiPageWikiLink Nondestructive_testing.
- Ellipsometry wikiPageWikiLink OLED.
- Ellipsometry wikiPageWikiLink Optics.
- Ellipsometry wikiPageWikiLink Paul_Drude.
- Ellipsometry wikiPageWikiLink Permittivity.
- Ellipsometry wikiPageWikiLink Phase_(waves).
- Ellipsometry wikiPageWikiLink Phonon.
- Ellipsometry wikiPageWikiLink Photoelastic_modulator.
- Ellipsometry wikiPageWikiLink Plasmon.
- Ellipsometry wikiPageWikiLink Polarimetry.
- Ellipsometry wikiPageWikiLink Polarization_(waves).
- Ellipsometry wikiPageWikiLink Polarizer.
- Ellipsometry wikiPageWikiLink Reflection_(physics).
- Ellipsometry wikiPageWikiLink Refractive_index.
- Ellipsometry wikiPageWikiLink Refractive_index_and_extinction_coefficient_of_thin_film_materials.
- Ellipsometry wikiPageWikiLink Scattering.
- Ellipsometry wikiPageWikiLink Semiconductor.
- Ellipsometry wikiPageWikiLink Sensor.
- Ellipsometry wikiPageWikiLink Sol-gel.
- Ellipsometry wikiPageWikiLink Spectroscopy.
- Ellipsometry wikiPageWikiLink Stokes_parameters.
- Ellipsometry wikiPageWikiLink Stray_light.
- Ellipsometry wikiPageWikiLink Surface_roughness.
- Ellipsometry wikiPageWikiLink Thin_film.
- Ellipsometry wikiPageWikiLink Transmittance.
- Ellipsometry wikiPageWikiLink Ultraviolet.
- Ellipsometry wikiPageWikiLink Visible_spectrum.
- Ellipsometry wikiPageWikiLink Wavelength.
- Ellipsometry wikiPageWikiLink Waveplate.
- Ellipsometry wikiPageWikiLink Wiktionary:Homogeneity.
- Ellipsometry wikiPageWikiLink Ångström.
- Ellipsometry wikiPageWikiLink File:Ellipsometry_setup.svg.
- Ellipsometry wikiPageWikiLinkText "''ψ'' and ''δ''".
- Ellipsometry wikiPageWikiLinkText "Ellipsometry".
- Ellipsometry wikiPageWikiLinkText "Ellipsometry#Imaging ellipsometry".
- Ellipsometry wikiPageWikiLinkText "Spectroscopic ellipsometry".
- Ellipsometry wikiPageWikiLinkText "ellipsometers".
- Ellipsometry wikiPageWikiLinkText "ellipsometry".
- Ellipsometry wikiPageWikiLinkText "in situ".
- Ellipsometry wikiPageWikiLinkText "phase modulator for ellipsometry".
- Ellipsometry wikiPageUsesTemplate Template:More_footnotes.
- Ellipsometry wikiPageUsesTemplate Template:Reflist.
- Ellipsometry subject Category:Optical_metrology.
- Ellipsometry subject Category:Radiometry.
- Ellipsometry subject Category:Spectroscopy.
- Ellipsometry hypernym Technique.
- Ellipsometry type TopicalConcept.
- Ellipsometry type Physic.
- Ellipsometry type Technique.
- Ellipsometry comment "Ellipsometry is an optical technique for investigating the dielectric properties (complex refractive index or dielectric function) of thin films. Ellipsometry can be used to characterize composition, roughness, thickness (depth), crystalline nature, doping concentration, electrical conductivity and other material properties.".