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- Design_for_testing abstract "Design for testing or design for testability (DFT) consists of IC design techniques that add testability features to a hardware product design. The added features make it easier to develop and apply manufacturing tests to the designed hardware. The purpose of manufacturing tests is to validate that the product hardware contains no manufacturing defects that could adversely affect the product’s correct functioning.Tests are applied at several steps in the hardware manufacturing flow and, for certain products, may also be used for hardware maintenance in the customer’s environment. The tests are generally driven by test programs that execute using automatic test equipment (ATE) or, in the case of system maintenance, inside the assembled system itself. In addition to finding and indicating the presence of defects (i.e., the test fails), tests may be able to log diagnostic information about the nature of the encountered test fails. The diagnostic information can be used to locate the source of the failure. In other words, the response of vectors (patterns) from a good circuit is compared with the response of vectors (using the same patterns) from a DUT (device under test). If the response is the same or matches, the circuit is good. Otherwise, the circuit is not manufactured as it was intended. DFT plays an important role in the development of test programs and as an interface for test application and diagnostics. Automatic test pattern generation, or ATPG, is much easier if appropriate DFT rules and suggestions have been implemented.".
- Design_for_testing wikiPageExternalLink SCI_paper.pdf.
- Design_for_testing wikiPageExternalLink ssya002c.pdf.
- Design_for_testing wikiPageExternalLink Tips_DFT_Considerations_Board_Level_Design.htm.
- Design_for_testing wikiPageExternalLink Tips_DFT_Considerations_Boundary_Scan_Chain.htm.
- Design_for_testing wikiPageExternalLink Boundary-Scan_DFT_Guidelines.pdf.
- Design_for_testing wikiPageID "2634162".
- Design_for_testing wikiPageLength "13582".
- Design_for_testing wikiPageOutDegree "42".
- Design_for_testing wikiPageRevisionID "704303154".
- Design_for_testing wikiPageWikiLink Acceptance_testing.
- Design_for_testing wikiPageWikiLink Analog_computer.
- Design_for_testing wikiPageWikiLink Automatic_test_equipment.
- Design_for_testing wikiPageWikiLink Automatic_test_pattern_generation.
- Design_for_testing wikiPageWikiLink Built-in_self-test.
- Design_for_testing wikiPageWikiLink Category:Design_for_X.
- Design_for_testing wikiPageWikiLink Category:Electronic_design_automation.
- Design_for_testing wikiPageWikiLink Category:Hardware_testing.
- Design_for_testing wikiPageWikiLink Clock_signal.
- Design_for_testing wikiPageWikiLink Computational_complexity_theory.
- Design_for_testing wikiPageWikiLink Computer_memory.
- Design_for_testing wikiPageWikiLink Controllability.
- Design_for_testing wikiPageWikiLink Design_for_X.
- Design_for_testing wikiPageWikiLink Electromechanics.
- Design_for_testing wikiPageWikiLink Electronic_design_automation.
- Design_for_testing wikiPageWikiLink Fault_grading.
- Design_for_testing wikiPageWikiLink Flip-flop_(electronics).
- Design_for_testing wikiPageWikiLink Functional_verification.
- Design_for_testing wikiPageWikiLink Iddq_testing.
- Design_for_testing wikiPageWikiLink output.
- Design_for_testing wikiPageWikiLink Integrated_circuit_design.
- Design_for_testing wikiPageWikiLink Joint_Test_Action_Group.
- Design_for_testing wikiPageWikiLink Logic_gate.
- Design_for_testing wikiPageWikiLink Moores_law.
- Design_for_testing wikiPageWikiLink Multi-chip_module.
- Design_for_testing wikiPageWikiLink Multiplexer.
- Design_for_testing wikiPageWikiLink Netlist.
- Design_for_testing wikiPageWikiLink Observability.
- Design_for_testing wikiPageWikiLink Printed_circuit_board.
- Design_for_testing wikiPageWikiLink Scan_chain.
- Design_for_testing wikiPageWikiLink Semiconductor_device_fabrication.
- Design_for_testing wikiPageWikiLink Serial_Vector_Format.
- Design_for_testing wikiPageWikiLink State_(computer_science).
- Design_for_testing wikiPageWikiLink State_space.
- Design_for_testing wikiPageWikiLink Test_automation.
- Design_for_testing wikiPageWikiLink Test_compression.
- Design_for_testing wikiPageWikiLink Three-state_logic.
- Design_for_testing wikiPageWikiLink Wafer_(electronics).
- Design_for_testing wikiPageWikiLinkText "DFT scan design".
- Design_for_testing wikiPageWikiLinkText "Design for testing".
- Design_for_testing wikiPageWikiLinkText "design for testing".
- Design_for_testing subject Category:Design_for_X.
- Design_for_testing subject Category:Electronic_design_automation.
- Design_for_testing subject Category:Hardware_testing.
- Design_for_testing type Redirect.
- Design_for_testing comment "Design for testing or design for testability (DFT) consists of IC design techniques that add testability features to a hardware product design. The added features make it easier to develop and apply manufacturing tests to the designed hardware.".
- Design_for_testing label "Design for testing".
- Design_for_testing sameAs Q5264347.
- Design_for_testing sameAs m.07t6w8.
- Design_for_testing sameAs Q5264347.
- Design_for_testing sameAs 可测试性设计.
- Design_for_testing wasDerivedFrom Design_for_testing?oldid=704303154.
- Design_for_testing isPrimaryTopicOf Design_for_testing.