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- Deep-level_transient_spectroscopy abstract "Deep-level transient spectroscopy (DLTS) is an experimental tool for studying electrically active defects (known as charge carrier traps) in semiconductors. DLTS establishes fundamental defect parameters and measures their concentration in the material. Some of the parameters are considered as defect \"finger prints\" used for their identifications and analysis.DLTS investigates defects present in a space charge (depletion) region of a simple electronic device. The most commonly used are Schottky diodes or p-n junctions. In the measurement process the steady-state diode reverse polarization voltage is disturbed by a voltage pulse. This voltage pulse reduces the electric field in the space charge region and allows free carriers from the semiconductor bulk to penetrate this region and recharge the defects causing their non-equilibrium charge state. After the pulse, when the voltage returns to its steady-state value, the defects start to emit trapped carriers due to the thermal emission process. The technique observes the device space charge region capacitance where the defect charge state recovery causes the capacitance transient. The voltage pulse followed by the defect charge state recovery are cycled allowing an application of different signal processing methods for defect recharging process analysis.The DLTS technique has a higher sensitivity than almost any other semiconductor diagnostic technique. For example, in silicon it can detect impurities and defects at a concentration of one part in 1012 of the material host atoms. This feature together with a technical simplicity of its design made it very popular in research labs and semiconductor material production factories.The DLTS technique was pioneered by David Vern Lang at Bell Laboratories in 1974. US Patent was awarded to Lang in 1975.".
- Deep-level_transient_spectroscopy thumbnail Typowe_widmo_konwencjonalnego_DLTS.jpg?width=300.
- Deep-level_transient_spectroscopy wikiPageExternalLink index.php.
- Deep-level_transient_spectroscopy wikiPageExternalLink www.laplacedlts.eu.
- Deep-level_transient_spectroscopy wikiPageExternalLink LaplaceIFPAN_2defects.htm.
- Deep-level_transient_spectroscopy wikiPageID "1670347".
- Deep-level_transient_spectroscopy wikiPageLength "13157".
- Deep-level_transient_spectroscopy wikiPageOutDegree "53".
- Deep-level_transient_spectroscopy wikiPageRevisionID "705573118".
- Deep-level_transient_spectroscopy wikiPageWikiLink Activation_energy.
- Deep-level_transient_spectroscopy wikiPageWikiLink Arrhenius_equation.
- Deep-level_transient_spectroscopy wikiPageWikiLink Band_gap.
- Deep-level_transient_spectroscopy wikiPageWikiLink Boxcar_function.
- Deep-level_transient_spectroscopy wikiPageWikiLink Capacitance.
- Deep-level_transient_spectroscopy wikiPageWikiLink Capacitance–voltage_profiling.
- Deep-level_transient_spectroscopy wikiPageWikiLink Carrier_generation_and_recombination.
- Deep-level_transient_spectroscopy wikiPageWikiLink Category:Semiconductor_analysis.
- Deep-level_transient_spectroscopy wikiPageWikiLink Category:Spectroscopy.
- Deep-level_transient_spectroscopy wikiPageWikiLink Charge_carrier.
- Deep-level_transient_spectroscopy wikiPageWikiLink Depletion_region.
- Deep-level_transient_spectroscopy wikiPageWikiLink Dielectric.
- Deep-level_transient_spectroscopy wikiPageWikiLink Digitizing.
- Deep-level_transient_spectroscopy wikiPageWikiLink Doping_(semiconductor).
- Deep-level_transient_spectroscopy wikiPageWikiLink Effective_mass_(solid-state_physics).
- Deep-level_transient_spectroscopy wikiPageWikiLink Electron.
- Deep-level_transient_spectroscopy wikiPageWikiLink Electron_hole.
- Deep-level_transient_spectroscopy wikiPageWikiLink Electronic_band_structure.
- Deep-level_transient_spectroscopy wikiPageWikiLink Energy_level.
- Deep-level_transient_spectroscopy wikiPageWikiLink Fermi_level.
- Deep-level_transient_spectroscopy wikiPageWikiLink Frenkel_defect.
- Deep-level_transient_spectroscopy wikiPageWikiLink High-κ_dielectric.
- Deep-level_transient_spectroscopy wikiPageWikiLink Interface_(chemistry).
- Deep-level_transient_spectroscopy wikiPageWikiLink Inverse_Laplace_transform.
- Deep-level_transient_spectroscopy wikiPageWikiLink Kelvin.
- Deep-level_transient_spectroscopy wikiPageWikiLink Laplace_transform.
- Deep-level_transient_spectroscopy wikiPageWikiLink Liquid_nitrogen.
- Deep-level_transient_spectroscopy wikiPageWikiLink Lock-in_amplifier.
- Deep-level_transient_spectroscopy wikiPageWikiLink MOSFET.
- Deep-level_transient_spectroscopy wikiPageWikiLink PIN_diode.
- Deep-level_transient_spectroscopy wikiPageWikiLink Photon.
- Deep-level_transient_spectroscopy wikiPageWikiLink Polarization_voltage.
- Deep-level_transient_spectroscopy wikiPageWikiLink Pulse_(signal_processing).
- Deep-level_transient_spectroscopy wikiPageWikiLink P–n_junction.
- Deep-level_transient_spectroscopy wikiPageWikiLink Quantum_dot.
- Deep-level_transient_spectroscopy wikiPageWikiLink Schottky_defect.
- Deep-level_transient_spectroscopy wikiPageWikiLink Schottky_diode.
- Deep-level_transient_spectroscopy wikiPageWikiLink Semiconductor.
- Deep-level_transient_spectroscopy wikiPageWikiLink Semiconductor_device.
- Deep-level_transient_spectroscopy wikiPageWikiLink Signal_processing.
- Deep-level_transient_spectroscopy wikiPageWikiLink Silicon.
- Deep-level_transient_spectroscopy wikiPageWikiLink Stress_(mechanics).
- Deep-level_transient_spectroscopy wikiPageWikiLink Thermally_stimulated_current_spectroscopy.
- Deep-level_transient_spectroscopy wikiPageWikiLink Vacancy_defect.
- Deep-level_transient_spectroscopy wikiPageWikiLink Wide-bandgap_semiconductor.
- Deep-level_transient_spectroscopy wikiPageWikiLink File:Typowe_widmo_konwencjonalnego_DLTS.jpg.
- Deep-level_transient_spectroscopy wikiPageWikiLinkText "DLTS".
- Deep-level_transient_spectroscopy wikiPageWikiLinkText "Deep-level transient spectroscopy".
- Deep-level_transient_spectroscopy wikiPageWikiLinkText "deep-level transient spectroscopy".
- Deep-level_transient_spectroscopy wikiPageWikiLinkText "large-signal transient voltage".
- Deep-level_transient_spectroscopy wikiPageUsesTemplate Template:Reflist.
- Deep-level_transient_spectroscopy subject Category:Semiconductor_analysis.
- Deep-level_transient_spectroscopy subject Category:Spectroscopy.
- Deep-level_transient_spectroscopy hypernym Tool.
- Deep-level_transient_spectroscopy type Software.
- Deep-level_transient_spectroscopy type Physic.
- Deep-level_transient_spectroscopy type Semiconductor.
- Deep-level_transient_spectroscopy type Technique.
- Deep-level_transient_spectroscopy comment "Deep-level transient spectroscopy (DLTS) is an experimental tool for studying electrically active defects (known as charge carrier traps) in semiconductors. DLTS establishes fundamental defect parameters and measures their concentration in the material. Some of the parameters are considered as defect \"finger prints\" used for their identifications and analysis.DLTS investigates defects present in a space charge (depletion) region of a simple electronic device.".
- Deep-level_transient_spectroscopy label "Deep-level transient spectroscopy".
- Deep-level_transient_spectroscopy sameAs Q176282.
- Deep-level_transient_spectroscopy sameAs Spettroscopia_dei_transitori_di_livello_profondo.
- Deep-level_transient_spectroscopy sameAs DLTS.
- Deep-level_transient_spectroscopy sameAs Spektroskopia_poziomów_energetycznych_defektów.
- Deep-level_transient_spectroscopy sameAs m.05m46f.
- Deep-level_transient_spectroscopy sameAs Q176282.
- Deep-level_transient_spectroscopy wasDerivedFrom Deep-level_transient_spectroscopy?oldid=705573118.
- Deep-level_transient_spectroscopy depiction Typowe_widmo_konwencjonalnego_DLTS.jpg.
- Deep-level_transient_spectroscopy isPrimaryTopicOf Deep-level_transient_spectroscopy.